{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,27]],"date-time":"2026-03-27T20:59:28Z","timestamp":1774645168334,"version":"3.50.1"},"reference-count":54,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100010218","name":"Tata Consultancy Services Research Scholarship Program","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100010218","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Department of Science and Technology (DST) Promotion of University Research and Scientific Excellence (PURSE), Government of India","award":["SR\/PURSE\/2023\/172"],"award-info":[{"award-number":["SR\/PURSE\/2023\/172"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2026,1]]},"DOI":"10.1109\/tcsi.2025.3569769","type":"journal-article","created":{"date-parts":[[2025,5,20]],"date-time":"2025-05-20T13:18:00Z","timestamp":1747747080000},"page":"453-465","source":"Crossref","is-referenced-by-count":0,"title":["Fault-Tolerant Design Framework for Probabilistic-Bit (P-Bit) Systems: Proposal and Analysis"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2996-4925","authenticated-orcid":false,"given":"Amina","family":"Haroon","sequence":"first","affiliation":[{"name":"Department of Electronics and Communication Engineering, Indraprastha Institute of Information Technology (IIIT) Delhi, Delhi, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0587-3391","authenticated-orcid":false,"given":"Sneh","family":"Saurabh","sequence":"additional","affiliation":[{"name":"Department of Electronics and Communication Engineering, Indraprastha Institute of Information Technology (IIIT) Delhi, Delhi, India"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JXCDC.2023.3256981"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-024-46645-6"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/EDTM58488.2024.10512188"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-024-01182-4"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2768321"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-019-1557-9"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2020.3039682"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2015.39"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2016.2547779"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ITC50571.2021.00022"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED57927.2023.10129319"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2121913"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2022.3191990"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386963"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000134"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ATS59501.2023.10317952"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2019.2960375"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2533438"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2019.8791518"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.48.08HD02"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/DRC.2011.5994447"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2022.3218138"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2017.2736498"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1063\/1.4908142"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2630315"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2023.3244139"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1142\/S2010324720500010"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/LMAG.2019.2956913"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-024-48152-0"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID57277.2023.00069"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1103\/physrevapplied.17.014016"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS48704.2020.9184556"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2024.3461770"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6528\/ad455a"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6528\/adac66"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1103\/physrevx.7.031014"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2019.2897964"},{"key":"ref38","volume-title":"Predictive Technology Model (PTM)","year":"2025"},{"issue":"11","key":"ref39","doi-asserted-by":"crossref","first-page":"2278","DOI":"10.1109\/5.726791","article-title":"Gradient-based learning applied to document recognition","volume":"86","author":"Lecun","year":"1998","journal-title":"Proc. IEEE"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1145\/1015330.1015435"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2023.3240659"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2018.8368656"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS54261.2022.9770168"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID2022.2022.00061"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1002\/0471200611"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1039\/D3NA01166F"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1063\/5.0157394"},{"key":"ref48","volume-title":"Cadence Virtuoso Schematic Editor","year":"2025"},{"key":"ref49","article-title":"Revisiting the importance of individual units in CNNs via ablation","author":"Zhou","year":"2018","journal-title":"arXiv:1806.02891"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2021.3088685"},{"key":"ref51","first-page":"299","volume-title":"CMOS Digital Integrated Circuits: Analysis and Design","author":"Leblebici","year":"1996"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/92.820765"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1017\/9781009200790"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/LMAG.2019.2910787"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8919\/11345139\/11007578.pdf?arnumber=11007578","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,27]],"date-time":"2026-03-27T19:54:15Z","timestamp":1774641255000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11007578\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,1]]},"references-count":54,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2025.3569769","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,1]]}}}