{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,27]],"date-time":"2025-11-27T05:36:46Z","timestamp":1764221806317,"version":"3.46.0"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Research and Development Program through the National Research Foundation of Korea (NRF), Ministry of Science and ICT","award":["RS-2023-00213402","2022M3I8A2079227"],"award-info":[{"award-number":["RS-2023-00213402","2022M3I8A2079227"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1109\/tcsi.2025.3576172","type":"journal-article","created":{"date-parts":[[2025,6,30]],"date-time":"2025-06-30T13:41:04Z","timestamp":1751290864000},"page":"7915-7927","source":"Crossref","is-referenced-by-count":0,"title":["Adaptive Column-Wise Multi-Gain HDR CMOS Image Sensor for Single-Shot HDR Imaging"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-5064-4335","authenticated-orcid":false,"given":"Dong-Yeon","family":"Lee","sequence":"first","affiliation":[{"name":"Department of Semiconductor Engineering, Seoul National University of Science and Technology, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-5713-6753","authenticated-orcid":false,"given":"Tae-Hoon","family":"Eom","sequence":"additional","affiliation":[{"name":"Department of Semiconductor Engineering, Seoul National University of Science and Technology, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0516-5811","authenticated-orcid":false,"given":"Hyeon-June","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Semiconductor Engineering, Seoul National University of Science and Technology, Seoul, South Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/isscc19947.2020.9063095"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.engstruct.2024.118514"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/lssc.2024.3370797"},{"key":"ref4","first-page":"1777","article-title":"Zero-reference deep curve estimation for low-light image enhancement","volume-title":"Proc. CVPR","author":"Guo"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2021.3091018"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2020.3038621"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3144205"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2019.2963386"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2016.2639741"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2022.3155482"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2024.3433003"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2022.3166716"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2022.3164370"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2008.2003023"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2021.3059909"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2020.3012980"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/bf00344251"},{"key":"ref18","article-title":"Comparison of methods generalizing Max- and average-pooling","author":"Bieder","year":"2021","journal-title":"arXiv:2103.01746"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-022-06953-8"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2015.2451791"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3440392"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2021.3102003"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2023.3263461"},{"key":"ref24","article-title":"Categorical reparameterization with gumbel-softmax","author":"Jang","year":"2016","journal-title":"arXiv:1611.01144"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/3130800.3130816"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/tip.2020.2971346"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/tip.2021.3064433"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1117\/12.2040003"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/3072959.3073609"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/tip.2003.819861"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2019.2959486"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2023.3323363"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2024.3449320"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/iscas.2018.8351578"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8919\/11269679\/11060573.pdf?arnumber=11060573","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,27]],"date-time":"2025-11-27T05:30:54Z","timestamp":1764221454000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11060573\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12]]},"references-count":34,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2025.3576172","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"type":"print","value":"1549-8328"},{"type":"electronic","value":"1558-0806"}],"subject":[],"published":{"date-parts":[[2025,12]]}}}