{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,2]],"date-time":"2026-06-02T22:57:16Z","timestamp":1780441036677,"version":"3.54.1"},"reference-count":45,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["92367204"],"award-info":[{"award-number":["92367204"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2026,2]]},"DOI":"10.1109\/tcsi.2025.3602398","type":"journal-article","created":{"date-parts":[[2025,8,28]],"date-time":"2025-08-28T18:12:07Z","timestamp":1756404727000},"page":"1356-1366","source":"Crossref","is-referenced-by-count":5,"title":["Fault Diagnosis and Fault Tolerant Control for a Class of Re-Entrant Manufacturing Systems"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8000-7736","authenticated-orcid":false,"given":"Qing","family":"Gao","sequence":"first","affiliation":[{"name":"School of Automation Science and Electrical Engineering and the Embodied Intelligence Robotics Institute, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7707-6159","authenticated-orcid":false,"given":"Jianbin","family":"Qiu","sequence":"additional","affiliation":[{"name":"Research Institute of Intelligent Control and Systems, Harbin Institute of Technology, Harbin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5149-5918","authenticated-orcid":false,"given":"Steven X.","family":"Ding","sequence":"additional","affiliation":[{"name":"Institute for Automatic Control and Complex Systems, University of Duisburg–Essen, Duisburg, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/S0005-1098(00)00084-4"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1287\/opre.1060.0321"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2008.01.019"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2019.2908721"},{"issue":"16","key":"ref5","first-page":"4854","article-title":"Semiconductor wafer fabrication production planning using multi-fidelity simulation optimization","volume":"58","author":"Zhang","year":"2020","journal-title":"Int. J. Prod. Res."},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/3477.875450"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TRA.2003.810577"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2018.2859741"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/9.847750"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/70.964657"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2003.814268"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2019.1574041"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2007.903085"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2010.2046925"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2010.519736"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2012.07.002"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2025.3570294"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2024.124728"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.3531744"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2021.109902"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2023.3305308"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.3934\/dcdss.2023018"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2025.3542356"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2024.3514674"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-62004-5"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejcon.2021.06.023"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3048971"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3303153"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3049347"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2014.07.001"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.cnsns.2021.105955"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC64512.2025.11010504"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ad4c86"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/9.728881"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2012.2186635"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.mechmachtheory.2014.08.004"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1002\/0471224596"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2006.878732"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.cnsns.2019.104953"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/9.895564"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/9.898706"},{"key":"ref42","volume-title":"Semiconductor Manufacturing Technology","author":"Quirk","year":"2001"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1177\/0142331218778100"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2017.09.001"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2012.11.029"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8919\/11368669\/11143603.pdf?arnumber=11143603","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,1,30]],"date-time":"2026-01-30T21:06:59Z","timestamp":1769807219000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11143603\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,2]]},"references-count":45,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2025.3602398","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,2]]}}}