{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,6]],"date-time":"2026-04-06T21:01:44Z","timestamp":1775509304774,"version":"3.50.1"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:00:00Z","timestamp":1775001600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:00:00Z","timestamp":1775001600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:00:00Z","timestamp":1775001600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100004358","name":"Samsung","doi-asserted-by":"publisher","award":["IO201209-07917-01"],"award-info":[{"award-number":["IO201209-07917-01"]}],"id":[{"id":"10.13039\/100004358","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Korea Advanced Institute of Science and Technology (KAIST) Jang Young Sil Fellow Program"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2026,4]]},"DOI":"10.1109\/tcsi.2025.3618298","type":"journal-article","created":{"date-parts":[[2025,10,15]],"date-time":"2025-10-15T17:43:21Z","timestamp":1760550201000},"page":"2371-2382","source":"Crossref","is-referenced-by-count":1,"title":["A 12-Bit 600-MS\/s Pipelined ADC With Two-Stage High-Gain Dynamic Amplifier in 28-nm CMOS"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2931-1270","authenticated-orcid":false,"given":"Bo","family":"Gao","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-3510-7741","authenticated-orcid":false,"given":"Raymond","family":"Mabilangan","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-2722-4651","authenticated-orcid":false,"given":"Chang-Un","family":"Park","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5858-0453","authenticated-orcid":false,"given":"Kent Edrian","family":"Lozada","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1747-9882","authenticated-orcid":false,"given":"Ho-Jin","family":"Kim","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-6021-6813","authenticated-orcid":false,"given":"Youngjae","family":"Cho","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-1210-3466","authenticated-orcid":false,"given":"Michael","family":"Choi","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6947-7785","authenticated-orcid":false,"given":"Seung-Tak","family":"Ryu","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2361339"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3053893"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2889680"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9366051"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3307435"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42615.2023.10067258"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3408468"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3482567"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3471915"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2011.5937491"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2217873"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2926648"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.2990910"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3303217"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49661.2025.10904536"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3222162"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2747758"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2025.3551156"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2024.3466902"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2879923"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3268719"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2021.3114318"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3020194"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3290119"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/a-sscc60305.2024.10848587"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.891718"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2563780"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2024.3496490"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.836230"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3328385"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC55480.2022.9911468"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3507915"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8919\/11458063\/11204800.pdf?arnumber=11204800","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,4,6]],"date-time":"2026-04-06T20:00:00Z","timestamp":1775505600000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11204800\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,4]]},"references-count":32,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2025.3618298","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,4]]}}}