{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,24]],"date-time":"2026-04-24T03:04:24Z","timestamp":1776999864988,"version":"3.51.4"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U23A20351"],"award-info":[{"award-number":["U23A20351"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100017940","name":"Zhejiang Provincial Natural Science Foundation","doi-asserted-by":"publisher","award":["LDT23F0402"],"award-info":[{"award-number":["LDT23F0402"]}],"id":[{"id":"10.13039\/100017940","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100017940","name":"Zhejiang Provincial Natural Science Foundation","doi-asserted-by":"publisher","award":["LDT23F04021F04"],"award-info":[{"award-number":["LDT23F04021F04"]}],"id":[{"id":"10.13039\/100017940","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2026,3]]},"DOI":"10.1109\/tcsi.2025.3620879","type":"journal-article","created":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T18:08:05Z","timestamp":1761588485000},"page":"1981-1989","source":"Crossref","is-referenced-by-count":1,"title":["Performance Evaluation and Enhancement Scheme for RRAM-Based In-Memory Computing Circuits by Signal Integrity Analysis With Consideration of Electro-Thermal and Parasitic Effects"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-0074-3740","authenticated-orcid":false,"given":"Wenbo","family":"Wang","sequence":"first","affiliation":[{"name":"College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3035-9407","authenticated-orcid":false,"given":"Xingyu","family":"Zhai","sequence":"additional","affiliation":[{"name":"School of Criminal Investigation, Zhejiang Police College, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-9596-2326","authenticated-orcid":false,"given":"Jiarui","family":"Qiu","sequence":"additional","affiliation":[{"name":"College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1183-8090","authenticated-orcid":false,"given":"Hao","family":"Xie","sequence":"additional","affiliation":[{"name":"School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lunyao","family":"Wang","sequence":"additional","affiliation":[{"name":"College of Information Science and Engineering, Ningbo University, Ningbo, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3831-3876","authenticated-orcid":false,"given":"Yinshui","family":"Xia","sequence":"additional","affiliation":[{"name":"College of Information Science and Engineering, Ningbo University, Ningbo, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7613-1734","authenticated-orcid":false,"given":"Wenchao","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-02030-8"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2961505"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1186\/s11671-020-03299-9"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/sstr.202170010"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/2634-4386\/ac9012"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/5.0149393"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1002\/pssr.201900073"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-021-27575-z"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1021\/acsaelm.3c00034"},{"issue":"5","key":"ref10","doi-asserted-by":"crossref","first-page":"1377","DOI":"10.1109\/TED.2014.2311655","article-title":"3-D cross-point array operation on AlOy\/HfOx-based vertical resistive switching memory","volume":"61","author":"Gao","year":"2014","journal-title":"IEEE Trans. Electron Devices"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.201700152"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2950595"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/SNW56633.2022.9889066"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.5108650"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-020-00505-5"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3072200"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.202310193"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.3048034"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-022-04992-8"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2023.126682"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2023.3282653"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.23919\/emsci.2023.0015"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM13553.2020.9371968"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ASICON52560.2021.9620330"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2014.7001330"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2021.3093478"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD56317.2022.00013"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2017.2784364"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3180199"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.3390\/nano11051261"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2023.3266186"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.3390\/chips4010009"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2022.3172170"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.23919\/SNW57900.2023.10183930"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1002\/9781119078388"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2019.2917910"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3060798"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ACES-China56081.2022.10064737"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2024.3485029"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/5.726791"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8919\/11414245\/11217283.pdf?arnumber=11217283","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,27]],"date-time":"2026-03-27T19:54:24Z","timestamp":1774641264000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11217283\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,3]]},"references-count":40,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2025.3620879","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,3]]}}}