{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,2]],"date-time":"2026-06-02T21:06:31Z","timestamp":1780434391226,"version":"3.54.1"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003052","name":"Samsung Electronics Company Ltd.,","doi-asserted-by":"publisher","award":["IO251222-14910-01"],"award-info":[{"award-number":["IO251222-14910-01"]}],"id":[{"id":"10.13039\/501100003052","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2026,6]]},"DOI":"10.1109\/tcsi.2025.3636832","type":"journal-article","created":{"date-parts":[[2025,12,17]],"date-time":"2025-12-17T18:50:28Z","timestamp":1765997428000},"page":"3953-3961","source":"Crossref","is-referenced-by-count":0,"title":["A Separated Pre-Charge Sense Amplifier With Fast Sensing, Low Power, Small Area, and High Reliability for Hybrid MTJ\/CMOS Logic Circuits"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1732-842X","authenticated-orcid":false,"given":"Taegun","family":"Yim","sequence":"first","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-0652-1200","authenticated-orcid":false,"given":"Hongil","family":"Yoon","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/2663351"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/nmat2024"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tmag.2017.2701407"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tnano.2014.2375205"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISOCC.2017.8368792"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2015.7282195"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISOCC.2017.8368899"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2239320"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373420"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2023.3264693"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/access.2020.3020939"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/cicc.2011.6055392"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/access.2025.3543733"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2023.3318468"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/icee.2018.8472552"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2023.3323562"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/taes.2025.3599136"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2025.3562769"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/tdmr.2021.3060055"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1166\/jno.2018.2365"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/csicc49403.2020.9050077"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/tmag.2009.2024325"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/tmag.2011.2158810"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/tmag.2013.2297393"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISOCC50952.2020.9333037"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ICTA56932.2022.9963012"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12020447"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2015.7338407"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/tmag.2023.3291429"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2022.3190455"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8919\/11541279\/11301885.pdf?arnumber=11301885","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,2]],"date-time":"2026-06-02T20:10:08Z","timestamp":1780431008000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11301885\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,6]]},"references-count":30,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2025.3636832","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,6]]}}}