{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,30]],"date-time":"2026-07-30T05:58:36Z","timestamp":1785391116422,"version":"3.55.0"},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Natural Science Foundation of Xiamen, China","award":["3502Z202573049"],"award-info":[{"award-number":["3502Z202573049"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2026,8]]},"DOI":"10.1109\/tcsi.2026.3703855","type":"journal-article","created":{"date-parts":[[2026,6,23]],"date-time":"2026-06-23T19:47:53Z","timestamp":1782244073000},"page":"5725-5738","source":"Crossref","is-referenced-by-count":0,"title":["Open-Circuit Fault Diagnosis for Three-Level T-Type Inverters Based on Voltage Vector Trajectory Centroid Deviation Characteristics"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-5471-645X","authenticated-orcid":false,"given":"Minxuan","family":"Liao","sequence":"first","affiliation":[{"name":"Huaqiao University","place":["Xiamen, China"],"department":["Department of Electrical Engineering"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2045-454X","authenticated-orcid":false,"given":"Rongkun","family":"Wang","sequence":"additional","affiliation":[{"name":"Huaqiao University","place":["Xiamen, China"],"department":["Department of Electrical Engineering"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5625-4267","authenticated-orcid":false,"given":"Xinhua","family":"Guo","sequence":"additional","affiliation":[{"name":"Huaqiao University","place":["Xiamen, China"],"department":["Department of Electrical Engineering"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1737-4618","authenticated-orcid":false,"given":"Yiqing","family":"Liang","sequence":"additional","affiliation":[{"name":"Huaqiao University","place":["Xiamen, China"],"department":["Department of Electrical Engineering"]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2019.2920400"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2019.2898105"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2017.2682800"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2011.2124436"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3436122"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/access.2020.2978141"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2024.3429624"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2022.3230091"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/edpe.2015.7325263"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2023.3283580"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2020.3003058"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2022.3151731"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2021.3087488"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/edpe.2019.8883928"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/pesc.2005.1582009"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2016.2554540"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.23919\/icems.2018.8549104"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/icem60801.2024.10700333"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/iaecst60924.2023.10502908"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/safeprocess52771.2021.9693715"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2025.3548353"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8919\/11627725\/11575266.pdf?arnumber=11575266","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,30]],"date-time":"2026-07-30T05:03:10Z","timestamp":1785387790000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11575266\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,8]]},"references-count":21,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2026.3703855","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,8]]}}}