{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,9,13]],"date-time":"2023-09-13T20:08:34Z","timestamp":1694635714360},"reference-count":13,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2009,4,1]],"date-time":"2009-04-01T00:00:00Z","timestamp":1238544000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2009,4]]},"DOI":"10.1109\/tcsii.2009.2015394","type":"journal-article","created":{"date-parts":[[2009,4,8]],"date-time":"2009-04-08T13:28:04Z","timestamp":1239197284000},"page":"295-299","source":"Crossref","is-referenced-by-count":3,"title":["Delay Uncertainty Reduction by Gate Splitting"],"prefix":"10.1109","volume":"56","author":[{"given":"V.","family":"Agarwal","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Jin Sun","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.M.","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1287\/opre.9.2.145"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1994.326856"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1111\/j.1539-6924.1998.tb01301.x"},{"key":"ref13","year":"0","journal-title":"Berkeley PTM"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2005.1560100"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.180"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2007.358056"},{"key":"ref5","first-page":"133","article-title":"improving transient error tolerance of digital vlsi circuits using robustness compiler (roco)","author":"zhao","year":"2006","journal-title":"Proc Int Symp Quality Electron Des"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1992.307414"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297680"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1998.746355"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2000.839819"},{"key":"ref9","first-page":"699","article-title":"a new analytical scalable model for the substrate resistance in multi-finger rf mosfets","author":"han","year":"2004","journal-title":"Proc IEEE MTT-S Int Microw Symp Dig"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8920\/4814784\/04812091.pdf?arnumber=4812091","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T00:44:08Z","timestamp":1633913048000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4812091\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,4]]},"references-count":13,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2009.2015394","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2009,4]]}}}