{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,2]],"date-time":"2026-03-02T10:58:55Z","timestamp":1772449135021,"version":"3.50.1"},"reference-count":15,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2009,5,1]],"date-time":"2009-05-01T00:00:00Z","timestamp":1241136000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2009,5]]},"DOI":"10.1109\/tcsii.2009.2019161","type":"journal-article","created":{"date-parts":[[2009,4,28]],"date-time":"2009-04-28T20:12:41Z","timestamp":1240949561000},"page":"344-348","source":"Crossref","is-referenced-by-count":37,"title":["\u201cSplit ADC\u201d Calibration for All-Digital Correction of Time-Interleaved ADC Errors"],"prefix":"10.1109","volume":"56","author":[{"given":"J.A.","family":"McNeill","sequence":"first","affiliation":[]},{"given":"C.","family":"David","sequence":"additional","affiliation":[]},{"given":"M.","family":"Coln","sequence":"additional","affiliation":[]},{"given":"R.","family":"Croughwell","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2000.856093"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.917427"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2003.821306"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2004.838434"},{"key":"ref14","author":"croughwell","year":"2007","journal-title":"A 16-b 10 Msample\/s split-interleaved analog to digital converter"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2003.1234320"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/4.735531"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2008.2001830"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2003.821300"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2003.821302"},{"key":"ref8","author":"brannon","year":"2006","journal-title":"Aperture Uncertainty and ADC System Performance"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.834046"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.856291"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2005.1465896"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.905293"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8920\/4939458\/04895228.pdf?arnumber=4895228","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:51:39Z","timestamp":1633909899000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4895228\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,5]]},"references-count":15,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2009.2019161","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2009,5]]}}}