{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,23]],"date-time":"2025-09-23T12:57:51Z","timestamp":1758632271887},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2009,12,1]],"date-time":"2009-12-01T00:00:00Z","timestamp":1259625600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2009,12]]},"DOI":"10.1109\/tcsii.2009.2035274","type":"journal-article","created":{"date-parts":[[2009,12,9]],"date-time":"2009-12-09T15:31:31Z","timestamp":1260372691000},"page":"946-950","source":"Crossref","is-referenced-by-count":18,"title":["SPICE Behavioral Model of the Tunneling Field-Effect Transistor for Circuit Simulation"],"prefix":"10.1109","volume":"56","author":[{"family":"Yibin Hong","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Yue Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Litao Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Samudra","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Chun-Huat Heng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Yee-Chia Yeo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1993.394027"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1988.14952"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.801090"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/31.52727"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2004.1328846"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2007.893272"},{"key":"ref16","year":"2008","journal-title":"GSS Users Guide"},{"key":"ref17","first-page":"11","year":"1998","journal-title":"Star-Hspice Manual"},{"key":"ref18","year":"0"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.93.196805"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.821575"},{"key":"ref6","first-page":"163","article-title":"impact of soi, <ref_formula> <tex notation=\"tex\">$\\hbox{si}_{1-x}\\hbox{ge}_{x}\\hbox{oi}$<\/tex><\/ref_formula> and geoi substrates on cmos compatible tunnel fet performance","author":"mayer","year":"2008","journal-title":"IEDM Tech Dig"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IWJT.2008.4540025"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/1.2748366"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2008.4796839"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/5.915374"},{"key":"ref1","first-page":"139","article-title":"bandstructure effects in nanoscale mosfets","author":"lundstrom","year":"2004","journal-title":"IEDM Tech Dig"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MELCON.2008.4618555"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8920\/5353851\/05345792.pdf?arnumber=5345792","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T01:00:32Z","timestamp":1633914032000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5345792\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,12]]},"references-count":18,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2009.2035274","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2009,12]]}}}