{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,20]],"date-time":"2026-02-20T18:55:33Z","timestamp":1771613733187,"version":"3.50.1"},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2014,12,1]],"date-time":"2014-12-01T00:00:00Z","timestamp":1417392000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"Pracom"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2014,12]]},"DOI":"10.1109\/tcsii.2014.2356911","type":"journal-article","created":{"date-parts":[[2014,9,10]],"date-time":"2014-09-10T18:42:54Z","timestamp":1410374574000},"page":"952-956","source":"Crossref","is-referenced-by-count":20,"title":["Soft Error Detection and Correction Technique for Radiation Hardening Based on C-element and BICS"],"prefix":"10.1109","volume":"61","author":[{"given":"Daniel","family":"Gomez Toro","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Matthieu","family":"Arzel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fabrice","family":"Seguin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michel","family":"Jezequel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2011.6026599"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2006.60"},{"key":"ref12","first-page":"117","article-title":"Using low-pass filters in mitigation techniques against single-event transients in 45 nm technology LSIs","author":"uemura","year":"0","journal-title":"Proc 14th IEEE Int On-Line Testing Symp"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.910125"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488736"},{"key":"ref15","first-page":"59","article-title":"Formal development programs and proofs","author":"martin","year":"1990","journal-title":"Formal Program Transformations for VLSI Circuit Synthesis"},{"key":"ref16","article-title":"Mos Type Input Circuit","author":"kinugasa","year":"1992"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2013.6674775"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/23.556880"},{"key":"ref19","first-page":"1","article-title":"Soft error analysis and optimizations of C-elements in asynchronous circuits","author":"vaidyanathan","year":"0","journal-title":"2nd Workshop on System Effects of Logic Soft Errors"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2284604"},{"key":"ref3","year":"2011","journal-title":"Interntional Technology Roadmap for Semiconductors 2011 Edition Chapter Design p 6"},{"key":"ref6","first-page":"310","article-title":"Transistor sizing for radiation hardening","author":"zhou","year":"0","journal-title":"Proc 42nd Annu IEEE Int Rel Phys Symp"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2281138"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2012.6313868"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2009.5994705"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1147\/rd.401.0019"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-6217-1_1"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2010.2042613"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2006.103"},{"key":"ref21","first-page":"241","article-title":"Study of a cosmic ray impact on combinatorial logic circuits of an 8 bit SAR ADC in 65 nm CMOS technology","author":"gomez toro","year":"0","journal-title":"Proc IEEE 56th Int MWSCAS"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/6969132\/06895166.pdf?arnumber=6895166","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T15:59:14Z","timestamp":1642003154000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6895166\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,12]]},"references-count":21,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2014.2356911","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,12]]}}}