{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T12:55:35Z","timestamp":1715864135250},"reference-count":11,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2015,9,1]],"date-time":"2015-09-01T00:00:00Z","timestamp":1441065600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2015,9]]},"DOI":"10.1109\/tcsii.2015.2435851","type":"journal-article","created":{"date-parts":[[2015,5,21]],"date-time":"2015-05-21T18:46:48Z","timestamp":1432234008000},"page":"826-830","source":"Crossref","is-referenced-by-count":7,"title":["A Calibration Technique for Pipelined ADCs Using Self-Measurement and Histogram-Based Test Methods"],"prefix":"10.1109","volume":"62","author":[{"given":"Tohid","family":"Moosazadeh","sequence":"first","affiliation":[]},{"given":"Mohammad","family":"Yavari","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.845972"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.835826"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2031044"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2300199"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2006.1692882"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2008.925373"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2242208"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2014.105"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2006.880034"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2252518"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2003.816921"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/7229390\/07111262.pdf?arnumber=7111262","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:03:46Z","timestamp":1642003426000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7111262"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,9]]},"references-count":11,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2015.2435851","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,9]]}}}