{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T19:58:08Z","timestamp":1740167888484,"version":"3.37.3"},"reference-count":14,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2018,12,1]],"date-time":"2018-12-01T00:00:00Z","timestamp":1543622400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100003446","name":"Ministry of Education and Religious Affairs, Sport and Culture","doi-asserted-by":"publisher","award":["MIS 376996"],"award-info":[{"award-number":["MIS 376996"]}],"id":[{"id":"10.13039\/501100003446","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2018,12]]},"DOI":"10.1109\/tcsii.2018.2798503","type":"journal-article","created":{"date-parts":[[2018,1,25]],"date-time":"2018-01-25T19:16:58Z","timestamp":1516907818000},"page":"2027-2031","source":"Crossref","is-referenced-by-count":0,"title":["Reconfigurable RO-Path Delay Sensor"],"prefix":"10.1109","volume":"65","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6481-1844","authenticated-orcid":false,"given":"P.","family":"Sakellariou","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1414-7500","authenticated-orcid":false,"given":"V.","family":"Paliouras","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.882523"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783761"},{"journal-title":"Electronic Design Automation Synthesis Verification and Test","year":"2009","author":"wang","key":"ref12"},{"key":"ref13","article-title":"Low-power two’s-complement multiplication based on selective activation","author":"sakellariou","year":"2012","journal-title":"Proc Int Conf Electron Circuits Syst"},{"key":"ref14","article-title":"Multi-path ageing sensor for cost-efficient delay fault prediction","author":"sai","year":"0","journal-title":"IEEE Trans Circuits Syst II Exp Briefs"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008365428314"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2345289"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681644"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1120725.1120800"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2158124"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355742"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/988952.988988"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2319973"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2039270"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/8543340\/08269370.pdf?arnumber=8269370","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,27]],"date-time":"2022-01-27T02:56:46Z","timestamp":1643252206000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8269370\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,12]]},"references-count":14,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2018.2798503","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"type":"print","value":"1549-7747"},{"type":"electronic","value":"1558-3791"}],"subject":[],"published":{"date-parts":[[2018,12]]}}}