{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,18]],"date-time":"2026-03-18T14:21:01Z","timestamp":1773843661772,"version":"3.50.1"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61490702"],"award-info":[{"award-number":["61490702"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61773407"],"award-info":[{"award-number":["61773407"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61621062"],"award-info":[{"award-number":["61621062"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61803390"],"award-info":[{"award-number":["61803390"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Key Laboratory of Energy Saving Control and Safety Monitoring for Rail Transportation","award":["2017TP1002"],"award-info":[{"award-number":["2017TP1002"]}]},{"name":"Program of the Joint Pre-research Foundation of the Chinese Ministry of Education","award":["6141A0202210"],"award-info":[{"award-number":["6141A0202210"]}]},{"DOI":"10.13039\/501100002822","name":"Central South University","doi-asserted-by":"publisher","award":["2017zzts688"],"award-info":[{"award-number":["2017zzts688"]}],"id":[{"id":"10.13039\/501100002822","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100010083","name":"Hunan Provincial Innovation Foundation for Postgraduate","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100010083","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/tcsii.2018.2856862","type":"journal-article","created":{"date-parts":[[2018,7,17]],"date-time":"2018-07-17T18:43:06Z","timestamp":1531852986000},"page":"457-461","source":"Crossref","is-referenced-by-count":58,"title":["A Uniform Modeling Method Based on Open-Circuit Faults Analysis for NPC-Three-Level Converter"],"prefix":"10.1109","volume":"66","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7662-0471","authenticated-orcid":false,"given":"Tao","family":"Peng","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6205-9161","authenticated-orcid":false,"given":"Hongwei","family":"Tao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7648-6738","authenticated-orcid":false,"given":"Chao","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4759-0904","authenticated-orcid":false,"given":"Zhiwen","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2550-1509","authenticated-orcid":false,"given":"Chunhua","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0312-436X","authenticated-orcid":false,"given":"Weihua","family":"Gui","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7629-3266","authenticated-orcid":false,"given":"Hamid Reza","family":"Karimi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2620442"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2017.2789215"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2674610"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2733501"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2018.2794339"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2465299"},{"key":"ref16","author":"yang","year":"2016","journal-title":"Fault-injection Benchmark Platform for Traction Drive Control System (TDCS-FIB)"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"1770","DOI":"10.1109\/TIA.2009.2027535","article-title":"A literature review of IGBT fault diagnostic and protection methods for power inverters","volume":"45","author":"lu","year":"2009","journal-title":"IEEE Trans Ind Appl"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2049377"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2017.2721972"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2777378"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2016.2530299"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2695978"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/63.728348"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2013.2290282"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2007.905880"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/8653436\/08412130.pdf?arnumber=8412130","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T21:10:25Z","timestamp":1657746625000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8412130\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":16,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2018.2856862","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,3]]}}}