{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,31]],"date-time":"2025-10-31T07:51:16Z","timestamp":1761897076843,"version":"3.37.3"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Brazilian Research Funding Agencies CNPq and FAPERJ"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/tcsii.2019.2924807","type":"journal-article","created":{"date-parts":[[2019,6,25]],"date-time":"2019-06-25T20:18:03Z","timestamp":1561493883000},"page":"625-629","source":"Crossref","is-referenced-by-count":1,"title":["Closed-Form Analysis of Metastability Voltage in 28-nm UTBB FD-SOI CMOS Technology"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8120-2338","authenticated-orcid":false,"given":"Fabian","family":"Olivera","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8173-1283","authenticated-orcid":false,"given":"Antonio","family":"Petraglia","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/TCSI.2011.2112595"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1016\/j.sse.2015.11.015"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1016\/j.sse.2015.11.019"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/ISCAS.2017.8050353"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/4.58286"},{"key":"ref15","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-662-44482-5","author":"goll","year":"2015","journal-title":"Comparators in Nanometer CMOS Technology"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/TCSI.2009.2034233"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1016\/j.mejo.2018.06.001"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/TVLSI.2014.2384007"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1109\/TCSII.2006.883204"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TCSI.2012.2221195"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/JSSC.2004.829399"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1049\/el.2016.4001"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/JSSC.2014.2305075"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1016\/j.microrel.2017.11.017"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1016\/j.vlsi.2017.11.006"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1049\/iet-cds.2010.0092"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TCSII.2016.2563660"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TCSI.2014.2366811"},{"key":"ref20","doi-asserted-by":"crossref","first-page":"83","DOI":"10.1109\/TCSI.2009.2016182","article-title":"Criterion to evaluate input-offset voltage of a latch-type sense amplifier","volume":"57","author":"do","year":"2010","journal-title":"IEEE Trans Circuits Syst I Reg Papers"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/9048013\/08745497.pdf?arnumber=8745497","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,17]],"date-time":"2023-09-17T19:17:26Z","timestamp":1694978246000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8745497\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":20,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2019.2924807","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"type":"print","value":"1549-7747"},{"type":"electronic","value":"1558-3791"}],"subject":[],"published":{"date-parts":[[2020,4]]}}}