{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,5]],"date-time":"2026-02-05T21:46:01Z","timestamp":1770327961394,"version":"3.49.0"},"reference-count":15,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2020,8]]},"DOI":"10.1109\/tcsii.2019.2943121","type":"journal-article","created":{"date-parts":[[2019,9,24]],"date-time":"2019-09-24T01:03:47Z","timestamp":1569287027000},"page":"1394-1398","source":"Crossref","is-referenced-by-count":26,"title":["0.3 pJ\/Bit Machine Learning Resistant Strong PUF Using Subthreshold Voltage Divider Array"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2852-2938","authenticated-orcid":false,"given":"Abilash","family":"Venkatesh","sequence":"first","affiliation":[]},{"given":"Aishwarya Bahudhanam","family":"Venkatasubramaniyan","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8983-0729","authenticated-orcid":false,"given":"Xiaodan","family":"Xi","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4045-6291","authenticated-orcid":false,"given":"Arindam","family":"Sanyal","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2013.2279798"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIC.2017.8008503"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2018.2821267"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2018.8624014"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2016.7538972"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/WIFS.2012.6412622"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757433"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/cpe.805"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"763","DOI":"10.1109\/JSSC.2015.2506641","article-title":"Static physically unclonable functions for secure chip identification with 1.9&#x2013;5.8% native bit instability at 0.6&#x2013;1 V and 15 fJ\/bit in 65 nm","volume":"51","author":"alvarez","year":"2016","journal-title":"IEEE J Solid-State Circuits"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIC.2017.8008504"},{"key":"ref8","first-page":"1","article-title":"14.2 A physically unclonable function with BER$ < 10\\text{e}^{-8}$\n for robust chip authentication using oscillator collapse in 40nm CMOS","author":"yang","year":"2015","journal-title":"Proc IEEE Int Solid-State Circuits Conf (ISSCC)"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7417955"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"9","DOI":"10.1145\/1278480.1278484","article-title":"physical unclonable functions for device authentication and secret key generation","author":"suh","year":"2007","journal-title":"2007 44th ACM\/IEEE Design Automation Conference DAC"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2004.1346548"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2017.8050671"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/9152175\/08846235.pdf?arnumber=8846235","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T16:55:12Z","timestamp":1651078512000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8846235\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,8]]},"references-count":15,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2019.2943121","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,8]]}}}