{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,17]],"date-time":"2025-10-17T14:08:05Z","timestamp":1760710085137,"version":"3.37.3"},"reference-count":10,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61904001","61904047","61974001","61704001","61874156"],"award-info":[{"award-number":["61904001","61904047","61974001","61704001","61874156"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003995","name":"Anhui Provincial Natural Science Foundation","doi-asserted-by":"publisher","award":["1808085QF196","1908085QF272"],"award-info":[{"award-number":["1808085QF196","1908085QF272"]}],"id":[{"id":"10.13039\/501100003995","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Key Projects of Natural Science Research of Universities in Anhui Province","award":["KJ2016A001","KJ2019A0163"],"award-info":[{"award-number":["KJ2016A001","KJ2019A0163"]}]},{"DOI":"10.13039\/501100014762","name":"Anhui Polytechnic University Research Startup Foundation","doi-asserted-by":"publisher","award":["2018YQQ007"],"award-info":[{"award-number":["2018YQQ007"]}],"id":[{"id":"10.13039\/501100014762","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2020,11]]},"DOI":"10.1109\/tcsii.2019.2962824","type":"journal-article","created":{"date-parts":[[2019,12,31]],"date-time":"2019-12-31T06:56:16Z","timestamp":1577775376000},"page":"2657-2661","source":"Crossref","is-referenced-by-count":30,"title":["Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6272-8660","authenticated-orcid":false,"given":"Tianming","family":"Ni","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6106-9613","authenticated-orcid":false,"given":"Hao","family":"Chang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7082-4211","authenticated-orcid":false,"given":"Tai","family":"Song","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0375-9800","authenticated-orcid":false,"given":"Qi","family":"Xu","sequence":"additional","affiliation":[]},{"given":"Zhengfeng","family":"Huang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0307-7236","authenticated-orcid":false,"given":"Huaguo","family":"Liang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0024-987X","authenticated-orcid":false,"given":"Aibin","family":"Yan","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8305-604X","authenticated-orcid":false,"given":"Xiaoqing","family":"Wen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2946243"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1587\/transele.E100.C.1108"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/82.868466"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"924","DOI":"10.7873\/DATE.2015.0072","article-title":"Feedback-Bus Oscillation Ring: A General Architecture for Delay Characterization and Test of Interconnects","author":"shi-yu huang","year":"2015","journal-title":"Design Automation Test in Europe Conference Exhibition (DATE)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2013.2290589"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2016.2590979"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2440322"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2018.2849028"},{"journal-title":"Nangate 45 nm Open Cell Library","year":"0","key":"ref9"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2895364"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/9242338\/08945146.pdf?arnumber=8945146","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T16:52:16Z","timestamp":1651078336000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8945146\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11]]},"references-count":10,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2019.2962824","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"type":"print","value":"1549-7747"},{"type":"electronic","value":"1558-3791"}],"subject":[],"published":{"date-parts":[[2020,11]]}}}