{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,24]],"date-time":"2025-03-24T06:00:21Z","timestamp":1742796021878,"version":"3.37.3"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004681","name":"Higher Education Commission, Government of Pakistan, under the Scholarship Program titled \u201cFaculty Development of UESTPs\/UETs\u201d","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004681","id-type":"DOI","asserted-by":"publisher"}]},{"name":"BK21 FOUR (Fostering Outstanding Universities for Research) funded by the Ministry of Education (MOE), South Korea"},{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2022,3]]},"DOI":"10.1109\/tcsii.2021.3108415","type":"journal-article","created":{"date-parts":[[2021,8,30]],"date-time":"2021-08-30T20:59:03Z","timestamp":1630357143000},"page":"1537-1541","source":"Crossref","is-referenced-by-count":2,"title":["Reliable Test Architecture With Test Cost Reduction for Systolic-Based DNN Accelerators"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4063-9525","authenticated-orcid":false,"given":"Muhammad","family":"Ibtesam","sequence":"first","affiliation":[{"name":"Department of Computer Science and Engineering, Hanyang University, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5336-7496","authenticated-orcid":false,"given":"Umair Saeed","family":"Solangi","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Engineering, Hanyang University, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5663-3307","authenticated-orcid":false,"given":"Jinuk","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Engineering, Hanyang University, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4675-5535","authenticated-orcid":false,"given":"Muhammad Adil","family":"Ansari","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Quaid-e-Awam University of Engineering Science and Technology, Larkana, Pakistan"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2322-232X","authenticated-orcid":false,"given":"Sungju","family":"Park","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Engineering, Hanyang University, Seoul, South Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.312"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/nature21056"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/nature16961"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3079856.3080246"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2616357"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2002.1181690"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC47002.2019.00042"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-014-5453-9"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2019.2947271"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2018.8465918"},{"key":"ref11","first-page":"1","article-title":"Sensitivity based error resilient techniques for energy efficient deep neural network accelerators","volume-title":"Proc. 56th Annual Design Autom. Conf.","author":"Choi"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ASP-DAC47756.2020.9045479"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2009.2034764"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2004.85"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2016.32"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2018.8368656"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1973.223651"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1976.5009199"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/0167-9260(89)90020-5"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1986.1270228"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3062240"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ITC-Asia.2019.00024"},{"article-title":"Enabling DFT and fast silicon bring-up for massive AI chip\u2014Case study","volume-title":"Proc. Int. Test Conf.","author":"Lau","key":"ref23"},{"volume-title":"AI chip DFT techniques for aggressive time-to-market","year":"2019","author":"Singhal","key":"ref24"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ATS49688.2020.9301581"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-94159-8_6"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/9736462\/09524822.pdf?arnumber=9524822","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T22:49:50Z","timestamp":1705013390000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9524822\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,3]]},"references-count":26,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2021.3108415","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"type":"print","value":"1549-7747"},{"type":"electronic","value":"1558-3791"}],"subject":[],"published":{"date-parts":[[2022,3]]}}}