{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,8]],"date-time":"2025-10-08T15:15:02Z","timestamp":1759936502758,"version":"3.37.3"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Georgia Tech Research Institute and the Georgia Electronic Design Center at Georgia Tech"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2022,3]]},"DOI":"10.1109\/tcsii.2021.3111177","type":"journal-article","created":{"date-parts":[[2021,9,9]],"date-time":"2021-09-09T19:58:17Z","timestamp":1631217497000},"page":"744-748","source":"Crossref","is-referenced-by-count":11,"title":["Design Methodology for a Wideband, Low Insertion Loss, Digital Step Attenuator in SiGe BiCMOS Technology"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2313-2917","authenticated-orcid":false,"given":"Clifford D.","family":"Cheon","sequence":"first","affiliation":[{"name":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6462-3387","authenticated-orcid":false,"given":"Sunil G.","family":"Rao","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5642-7992","authenticated-orcid":false,"given":"Wonsub","family":"Lim","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8665-1178","authenticated-orcid":false,"given":"Adilson S.","family":"Cardoso","sequence":"additional","affiliation":[{"name":"SEAL, Georgia Tech Research Institute, Atlanta, GA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4116-4496","authenticated-orcid":false,"given":"Moon-Kyu","family":"Cho","sequence":"additional","affiliation":[{"name":"School of Computer Engineering, Korea National University of Transportation, Chungju, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8268-5135","authenticated-orcid":false,"given":"John D.","family":"Cressler","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2988501"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2017.2786698"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2012.2195020"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2004325"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2013.2288694"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2922418"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2010.2049691"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2750203"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2827934"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.2999094"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2020.3020317"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/BCICTS48439.2020.9392983"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2014.2354017"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2017.8058650"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2014.6848608"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.907205"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/9736462\/09531940.pdf?arnumber=9531940","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T23:57:40Z","timestamp":1705017460000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9531940\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,3]]},"references-count":16,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2021.3111177","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"type":"print","value":"1549-7747"},{"type":"electronic","value":"1558-3791"}],"subject":[],"published":{"date-parts":[[2022,3]]}}}