{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,14]],"date-time":"2026-05-14T00:00:52Z","timestamp":1778716852717,"version":"3.51.4"},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2022,7,1]],"date-time":"2022-07-01T00:00:00Z","timestamp":1656633600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,7,1]],"date-time":"2022-07-01T00:00:00Z","timestamp":1656633600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,7,1]],"date-time":"2022-07-01T00:00:00Z","timestamp":1656633600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program","doi-asserted-by":"publisher","award":["2018YFA0701500"],"award-info":[{"award-number":["2018YFA0701500"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"NSFC","doi-asserted-by":"publisher","award":["61934005"],"award-info":[{"award-number":["61934005"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"NSFC","doi-asserted-by":"publisher","award":["62106125"],"award-info":[{"award-number":["62106125"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100005089","name":"Beijing Municipal Natural Science Foundation","doi-asserted-by":"publisher","award":["L211005"],"award-info":[{"award-number":["L211005"]}],"id":[{"id":"10.13039\/501100005089","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100017582","name":"Beijing National Research Center for Information Science and Technology","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100017582","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012282","name":"Beijing Innovation Center for Future Chips","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100012282","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2022,7]]},"DOI":"10.1109\/tcsii.2022.3163177","type":"journal-article","created":{"date-parts":[[2022,3,29]],"date-time":"2022-03-29T19:43:57Z","timestamp":1648583037000},"page":"3144-3148","source":"Crossref","is-referenced-by-count":8,"title":["Bit-Aware Fault-Tolerant Hybrid Retraining and Remapping Schemes for RRAM-Based Computing-in-Memory Systems"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4842-8781","authenticated-orcid":false,"given":"Yuxuan","family":"Huang","sequence":"first","affiliation":[{"name":"Department of Electronic Engineering, Tsinghua University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yifan","family":"He","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Tsinghua University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7160-4165","authenticated-orcid":false,"given":"Jingyu","family":"Wang","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Tsinghua University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8234-7400","authenticated-orcid":false,"given":"Jinshan","family":"Yue","sequence":"additional","affiliation":[{"name":"Chinese Academy of Sciences, Institute of Microelectronics, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lu","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Tsinghua University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kaiwei","family":"Zou","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Tsinghua University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2421-353X","authenticated-orcid":false,"given":"Huazhong","family":"Yang","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Tsinghua University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4892-2309","authenticated-orcid":false,"given":"Yongpan","family":"Liu","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Tsinghua University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2642198"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310397"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3064189"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001140"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001139"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3072200"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2014.12"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2017.2776980"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3062310"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2855145"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7926952"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3067385"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-01237-3_12"},{"key":"ref14","article-title":"DoReFa-Net: Training low bitwidth convolutional neural networks with low bitwidth gradients","volume-title":"arXiv:1606.06160","author":"Zhou","year":"2016"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/5.726791"},{"key":"ref16","article-title":"Very deep convolutional networks for large-scale image recognition","volume-title":"arXiv:1409.1556","author":"Simonyan","year":"2014"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2958568"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/9809796\/09744019.pdf?arnumber=9744019","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,18]],"date-time":"2024-01-18T00:09:34Z","timestamp":1705536574000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9744019\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,7]]},"references-count":18,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2022.3163177","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,7]]}}}