{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,17]],"date-time":"2025-09-17T16:31:51Z","timestamp":1758126711156,"version":"3.37.3"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2018YFB1700100"],"award-info":[{"award-number":["2018YFB1700100"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62173060"],"award-info":[{"award-number":["62173060"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2022,8]]},"DOI":"10.1109\/tcsii.2022.3169148","type":"journal-article","created":{"date-parts":[[2022,4,21]],"date-time":"2022-04-21T19:34:10Z","timestamp":1650569650000},"page":"3580-3584","source":"Crossref","is-referenced-by-count":7,"title":["Improved ADT Method for the Switched Nonlinear System: Stability Analysis and Application"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2779-5344","authenticated-orcid":false,"given":"Cui-Li","family":"Jin","sequence":"first","affiliation":[{"name":"Key Laboratory of Intelligent Control and Optimization for Industrial Equipment of Ministry of Education and the School of Control Science and Engineering, Dalian University of Technology, Dalian, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3672-3716","authenticated-orcid":false,"given":"Qing-Guo","family":"Wang","sequence":"additional","affiliation":[{"name":"Institute of Artificial Intelligence and Future Networks, Beijing Normal University, Zhuhai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8351-6816","authenticated-orcid":false,"given":"Rui","family":"Wang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Advanced Technology for Aerospace Vehicles, Liaoning Province and the School of Aeronautics and Astronautics, Dalian University of Technology, Dalian, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0143-1254","authenticated-orcid":false,"given":"Di","family":"Wu","sequence":"additional","affiliation":[{"name":"Key Laboratory of Intelligent Control and Optimization for Industrial Equipment of Ministry of Education and the School of Control Science and Engineering, Dalian University of Technology, Dalian, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2008.923688"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2011.2157413"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.21629\/JSEE.2019.04.16"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2011.2159793"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4612-0017-8"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2020.2978345"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2789165"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/00207721.2017.1407008"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2021.3096375"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2013.12.028"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2020.10.007"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2018.11.042"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cta.2018.5575"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2019.12.410"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2018.2852766"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2019.108800"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/9844876\/09761247.pdf?arnumber=9761247","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,24]],"date-time":"2024-01-24T01:10:53Z","timestamp":1706058653000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9761247\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,8]]},"references-count":16,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2022.3169148","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"type":"print","value":"1549-7747"},{"type":"electronic","value":"1558-3791"}],"subject":[],"published":{"date-parts":[[2022,8]]}}}