{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,30]],"date-time":"2026-04-30T16:54:58Z","timestamp":1777568098973,"version":"3.51.4"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2022,6,1]],"date-time":"2022-06-01T00:00:00Z","timestamp":1654041600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,6,1]],"date-time":"2022-06-01T00:00:00Z","timestamp":1654041600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,6,1]],"date-time":"2022-06-01T00:00:00Z","timestamp":1654041600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Israel Innovation Authority"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2022,6]]},"DOI":"10.1109\/tcsii.2022.3170460","type":"journal-article","created":{"date-parts":[[2022,4,26]],"date-time":"2022-04-26T19:32:47Z","timestamp":1651001567000},"page":"2551-2556","source":"Crossref","is-referenced-by-count":9,"title":["Preselection Methods to Achieve Very Low BER in SRAM-Based PUFs\u2014A Tutorial"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1089-1081","authenticated-orcid":false,"given":"Yizhak","family":"Shifman","sequence":"first","affiliation":[{"name":"Alexander Kofkin Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9184-8642","authenticated-orcid":false,"given":"Joseph","family":"Shor","sequence":"additional","affiliation":[{"name":"Alexander Kofkin Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/586110.586132"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2320516"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TTHZ.2016.2544142"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2018.2879216"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2014.083"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2019.8780246"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.2996772"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/OJCAS.2020.3034266"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2018.8579315"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2963002"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2019.8702612"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365741"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2020.3030945"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3028514"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2019.8780135"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310218"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2019.2923503"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-5040-5"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3042092"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS48785.2022.9937229"},{"key":"ref21","volume-title":"The Reliability of SRAM PUF","year":"2021"},{"key":"ref22","volume-title":"A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications","year":"2021"},{"key":"ref23","volume-title":"E-Handbook of Statistical Methods","year":"2021"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1214\/aoms\/1177729694"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2008.212"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/2517300.2517304"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/9786589\/09763027.pdf?arnumber=9763027","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T21:13:25Z","timestamp":1705958005000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9763027\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,6]]},"references-count":26,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2022.3170460","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,6]]}}}