{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,14]],"date-time":"2025-10-14T07:14:57Z","timestamp":1760426097734,"version":"3.37.3"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2023,3]]},"DOI":"10.1109\/tcsii.2022.3217416","type":"journal-article","created":{"date-parts":[[2022,11,3]],"date-time":"2022-11-03T23:21:24Z","timestamp":1667517684000},"page":"914-918","source":"Crossref","is-referenced-by-count":8,"title":["Robust Chaos With Novel 4-Transistor Maps"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1854-8739","authenticated-orcid":false,"given":"Maisha","family":"Sadia","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Mississippi, Oxford, MS, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8868-5854","authenticated-orcid":false,"given":"Partha Sarathi","family":"Paul","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Mississippi, Oxford, MS, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Md Razuan","family":"Hossain","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Mississippi, Oxford, MS, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2052-6096","authenticated-orcid":false,"given":"Barry","family":"Muldrey","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Mississippi, Oxford, MS, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4792-6236","authenticated-orcid":false,"given":"Md Sakib","family":"Hasan","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Mississippi, Oxford, MS, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1049\/el:20030881"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ECCTD.2005.1522999"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3453688.3461504"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS53924.2021.9665558"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS53924.2021.9665500"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2016.2611442"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3386263.3406922"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/SoutheastCon45413.2021.9401848"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/SoutheastCon45413.2021.9401936"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.4922976"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DCAS51144.2020.9330653"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.2999907"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2016.01.017"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2020.09.032"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/BF01020332"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1201\/9780429492563"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2015.2504180"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1152\/ajpheart.2000.278.6.h2039"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/e21060541"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/s41635-019-00085-7"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2016.2538358"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2018.8383903"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/10061496\/09930831.pdf?arnumber=9930831","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T22:08:57Z","timestamp":1705961337000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9930831\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3]]},"references-count":22,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2022.3217416","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"type":"print","value":"1549-7747"},{"type":"electronic","value":"1558-3791"}],"subject":[],"published":{"date-parts":[[2023,3]]}}}