{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T19:58:33Z","timestamp":1740167913680,"version":"3.37.3"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62073202"],"award-info":[{"award-number":["62073202"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Young Experts of Taishan Scholar Project","award":["tsqn201909076"],"award-info":[{"award-number":["tsqn201909076"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2023,3]]},"DOI":"10.1109\/tcsii.2022.3218955","type":"journal-article","created":{"date-parts":[[2022,11,4]],"date-time":"2022-11-04T01:45:45Z","timestamp":1667526345000},"page":"1029-1033","source":"Crossref","is-referenced-by-count":1,"title":["Fault Isolation of Logical Control Networks via Set Controllability of Augmented System"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2886-8736","authenticated-orcid":false,"given":"Yalu","family":"Li","sequence":"first","affiliation":[{"name":"School of Mathematics and Statistics, Shandong Normal University, Jinan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5322-5375","authenticated-orcid":false,"given":"Haitao","family":"Li","sequence":"additional","affiliation":[{"name":"School of Mathematics and Statistics, Shandong Normal University, Jinan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1016\/j.jtbi.2006.09.023"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TCSII.2022.3195182"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1016\/j.automatica.2009.03.006"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1007\/978-0-85729-097-7"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1142\/8323"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1016\/j.sysconle.2018.03.004"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1016\/j.automatica.2022.110172"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/MSP.2005.1407722"},{"key":"ref9","first-page":"1","article-title":"Fault detection problems for Boolean networks and Boolean control networks","volume-title":"Proc. 34th Chin. Control Conf.","author":"Fornasini"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/TAC.2015.2396646"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/TCYB.2018.2885124"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1016\/j.automatica.2013.05.004"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.3389\/fonc.2019.00263"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1016\/0022-5193(69)90015-0"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1039\/C0MB00263A"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/TAC.2013.2238092"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1016\/j.amc.2021.126259"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1142\/S0218127410025892"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1016\/j.sysconle.2022.105204"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1007\/s11432-017-9269-6"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1016\/j.automatica.2005.08.018"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/TCSII.2021.3123285"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1186\/1471-2164-13-S6-S4"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1109\/TCSII.2021.3107249"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1016\/j.amc.2021.126413"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1109\/TAC.2022.3184388"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1137\/140991285"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1016\/j.neucom.2019.05.087"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1109\/TAC.2019.2944903"},{"doi-asserted-by":"publisher","key":"ref30","DOI":"10.1109\/TAC.2017.2754947"},{"doi-asserted-by":"publisher","key":"ref31","DOI":"10.23919\/ACC.2018.8431676"},{"doi-asserted-by":"publisher","key":"ref32","DOI":"10.1016\/j.ins.2018.12.087"},{"doi-asserted-by":"publisher","key":"ref33","DOI":"10.1109\/TSP.2006.873740"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/10061496\/09935305.pdf?arnumber=9935305","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T22:11:05Z","timestamp":1705961465000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9935305\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3]]},"references-count":33,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2022.3218955","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"type":"print","value":"1549-7747"},{"type":"electronic","value":"1558-3791"}],"subject":[],"published":{"date-parts":[[2023,3]]}}}