{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,25]],"date-time":"2025-10-25T12:47:58Z","timestamp":1761396478700,"version":"3.37.3"},"reference-count":19,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T00:00:00Z","timestamp":1690848000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T00:00:00Z","timestamp":1690848000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T00:00:00Z","timestamp":1690848000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["SQ2022YFE020197"],"award-info":[{"award-number":["SQ2022YFE020197"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Shanghai Pujiang Program"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2023,8]]},"DOI":"10.1109\/tcsii.2023.3253707","type":"journal-article","created":{"date-parts":[[2023,3,7]],"date-time":"2023-03-07T19:27:15Z","timestamp":1678217235000},"page":"2724-2728","source":"Crossref","is-referenced-by-count":1,"title":["A Two-Phase Multi-Bit Incremental ADC With Variable Loop Order"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2484-6644","authenticated-orcid":false,"given":"Kaiquan","family":"Chen","sequence":"first","affiliation":[{"name":"Department of Micro–Nano Electronics, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8613-8689","authenticated-orcid":false,"given":"Biao","family":"Wang","sequence":"additional","affiliation":[{"name":"Shanghai X-Ring Technology Company Ltd., Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5616-9428","authenticated-orcid":false,"given":"Yan","family":"Liu","sequence":"additional","affiliation":[{"name":"Department of Micro–Nano Electronics, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1089-1498","authenticated-orcid":false,"given":"Fan","family":"Ye","sequence":"additional","affiliation":[{"name":"State Key Laboratory of ASIC and Systems, Fudan University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sai-Weng","family":"Sin","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Analog and Mixed-Signal VLSI, Institute of Microelectronics, University of Macau, Macau, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0235-1475","authenticated-orcid":false,"given":"Guoxing","family":"Wang","sequence":"additional","affiliation":[{"name":"Department of Micro–Nano Electronics, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5289-5219","authenticated-orcid":false,"given":"Yong","family":"Lian","sequence":"additional","affiliation":[{"name":"Department of EECS, York University, Toronto, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9512-4529","authenticated-orcid":false,"given":"Liang","family":"Qi","sequence":"additional","affiliation":[{"name":"Department of Micro–Nano Electronics, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3160325"},{"key":"ref12","first-page":"157","article-title":"High-order multi-bit incremental converter with smart-DEM algorithm","author":"liu","year":"2013","journal-title":"Proc IEEE Int Symp Circuits Syst (ISCAS)"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2892602"},{"key":"ref14","first-page":"1","article-title":"A high resolution multi-bit incremental converter insensitive to DAC mismatch error","author":"wang","year":"2016","journal-title":"Proc Ph D Rese Microelectron Electron Conf (PRIME)"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC47793.2019.9056948"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2022.3172395"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2018.8624017"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3180689"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2888872"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3033458"},{"key":"ref19","first-page":"85","author":"pavan","year":"2017","journal-title":"Understanding Delta–Sigma Data Converters"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2004.826202"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2413842"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2943171"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2693921"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2900150"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2016.2543261"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2018.2821365"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3072034"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/10198497\/10061593.pdf?arnumber=10061593","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,21]],"date-time":"2023-08-21T18:18:33Z","timestamp":1692641913000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10061593\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,8]]},"references-count":19,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2023.3253707","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"type":"print","value":"1549-7747"},{"type":"electronic","value":"1558-3791"}],"subject":[],"published":{"date-parts":[[2023,8]]}}}