{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,9]],"date-time":"2026-01-09T01:44:34Z","timestamp":1767923074580,"version":"3.49.0"},"reference-count":10,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2024,3]]},"DOI":"10.1109\/tcsii.2023.3319001","type":"journal-article","created":{"date-parts":[[2023,9,26]],"date-time":"2023-09-26T17:59:08Z","timestamp":1695751148000},"page":"1062-1066","source":"Crossref","is-referenced-by-count":2,"title":["Applying Nyquist\u2019s Stability Analysis to Bode Plots With Wrapped Phase Behavior"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5770-4138","authenticated-orcid":false,"given":"Saad","family":"Yousaf","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, Integrated Microsystems Laboratory, McGill University, Montreal, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4880-0272","authenticated-orcid":false,"given":"Gordon W.","family":"Roberts","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Integrated Microsystems Laboratory, McGill University, Montreal, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","first-page":"208","article-title":"A note on stability analysis using bode plots","volume":"35","author":"Hahn","year":"2001","journal-title":"Chem. Eng. Educ."},{"key":"ref2","volume-title":"The limitations of bode stability criterion\u2013tutorial note on failure of bode criterion","author":"Das","year":"2016"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2022.3167301"},{"key":"ref4","article-title":"Lehrbuch der Elektronen-R\u00f6hren und ihrer technischen Anwendungen","volume-title":"Textbook of Electron Tubes and Their Technical Applications","volume":"3","author":"Barkhausen","year":"1935"},{"key":"ref5","first-page":"253","article-title":"The barkhausen criterion (observation)","volume-title":"Proc. 18th IEEE Workshop Nonlinear Dyn. Electron. Syst.","author":"Lindberg"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/9.409"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/icarcv.2008.4795741"},{"key":"ref8","article-title":"On stability analysis by using Nyquist and Nichols charts","author":"Alavi","year":"2015","journal-title":"arXiv:1511.04752"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2884892"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2939636"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/10460332\/10263985.pdf?arnumber=10263985","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,8]],"date-time":"2024-03-08T02:18:00Z","timestamp":1709864280000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10263985\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,3]]},"references-count":10,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2023.3319001","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,3]]}}}