{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T08:13:07Z","timestamp":1769933587691,"version":"3.49.0"},"reference-count":19,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100005320","name":"Cooperation Project between Xidian University and Shenzhen Fuxin Technology Company Ltd.","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100005320","id-type":"DOI","asserted-by":"publisher"}]},{"name":"China National Key Research and Development Program","award":["2022YFF0605800"],"award-info":[{"award-number":["2022YFF0605800"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2024,3]]},"DOI":"10.1109\/tcsii.2023.3323384","type":"journal-article","created":{"date-parts":[[2023,10,10]],"date-time":"2023-10-10T19:41:28Z","timestamp":1696966888000},"page":"1156-1160","source":"Crossref","is-referenced-by-count":3,"title":["Semi-Supervised Transfer Learning Framework for Aging-Aware Library Characterization"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5236-9745","authenticated-orcid":false,"given":"Zhengguang","family":"Tang","sequence":"first","affiliation":[{"name":"Institute of Microelectronics, Xidian University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6289-6680","authenticated-orcid":false,"given":"Cong","family":"Li","sequence":"additional","affiliation":[{"name":"Institute of Microelectronics, Xidian University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3427-5320","authenticated-orcid":false,"given":"Hailong","family":"You","sequence":"additional","affiliation":[{"name":"Institute of Microelectronics, Xidian University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7323-5052","authenticated-orcid":false,"given":"Zhixiong","family":"Di","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, Southwest Jiaotong University, Chengdu, China"}]},{"given":"Linying","family":"Zhang","sequence":"additional","affiliation":[{"name":"Institute of Microelectronics, Xidian University, Xi’an, China"}]},{"given":"Xingming","family":"Liu","sequence":"additional","affiliation":[{"name":"Design For Reliability Group, SHENZHEN FUXIN Technology Company Ltd., Shenzhen, China"}]},{"given":"Yu","family":"Wang","sequence":"additional","affiliation":[{"name":"Design For Reliability Group, SHENZHEN FUXIN Technology Company Ltd., Shenzhen, China"}]},{"given":"Yong","family":"Dai","sequence":"additional","affiliation":[{"name":"Design For Reliability Group, SHENZHEN FUXIN Technology Company Ltd., Shenzhen, China"}]},{"given":"Geng","family":"Bai","sequence":"additional","affiliation":[{"name":"Design For Reliability Group, SHENZHEN FUXIN Technology Company Ltd., Shenzhen, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203890"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2882229"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6531971"},{"key":"ref4","first-page":"1","article-title":"Aadam: A fast, accurate, and versatile aging-aware cell library delay model using feed-forward neural network","volume-title":"Proc. 39th Int. Conf. Comput.-Aided Design","author":"Ebrahimipour"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3069664"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3147587"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3212123"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3201431"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3233\/JIFS-169689"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2020.3004555"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3934\/mbe.2021233"},{"key":"ref12","first-page":"908","article-title":"Semi-supervised regression with co-training","volume-title":"Proc. IJCAI","volume":"5","author":"Zhou"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3080294"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.5555\/1953048.2078195"},{"key":"ref15","volume-title":"Nangate open cell library"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.884077"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT.2010.5667399"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2912307"},{"key":"ref19","volume-title":"PULP platform","year":"2022"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/10460332\/10275089.pdf?arnumber=10275089","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,30]],"date-time":"2024-12-30T19:50:27Z","timestamp":1735588227000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10275089\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,3]]},"references-count":19,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2023.3323384","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,3]]}}}