{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,24]],"date-time":"2025-07-24T11:07:14Z","timestamp":1753355234803,"version":"3.37.3"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Discovery, Research Tools and Instruments, and Discovery Accelerator Grants provided"},{"DOI":"10.13039\/501100000038","name":"Natural Sciences and Engineering Research Council of Canada","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100000038","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100008676","name":"Canada Research Chair Program, by the CMC Microsystems","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100008676","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100008459","name":"University of Calgary","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100008459","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2024,3]]},"DOI":"10.1109\/tcsii.2023.3325809","type":"journal-article","created":{"date-parts":[[2023,10,19]],"date-time":"2023-10-19T18:33:05Z","timestamp":1697740385000},"page":"1022-1026","source":"Crossref","is-referenced-by-count":2,"title":["Induced Back-Gate Noise in FDSOI MOSFET"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0980-5844","authenticated-orcid":false,"given":"Mohammad","family":"Radpour","sequence":"first","affiliation":[{"name":"Department of Electrical and Software Engineering, University of Calgary, Calgary, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5228-6907","authenticated-orcid":false,"given":"Leonid","family":"Belostotski","sequence":"additional","affiliation":[{"name":"Department of Electrical and Software Engineering, University of Calgary, Calgary, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JRPROC.1962.288221"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1966.15724"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1049\/piee.1969.0343"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(71)90038-4"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/0378-4363(76)90091-7"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1080\/00207217808900818"},{"volume-title":"Noise in Solid State Devices and Circuits","year":"1986","author":"van der Ziel","key":"ref7"},{"volume-title":"Operation and Modeling of the MOS Transistor","year":"1987","author":"Tsividis","key":"ref8"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2006.320898"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1999.823868"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cds:20040373"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2004.838450"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2002.801229"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/55.778156"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.880370"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2019.8701875"},{"article-title":"Compact models for future generation CMOS","year":"2011","author":"Lu","key":"ref17"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/SiRF56960.2023.10046210"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2022.3198547"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2018.8351823"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.23919\/MIXDES.2019.8787017"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS47672.2021.9531807"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS47672.2021.9531739"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC54546.2022.9863196"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/tmtt.2023.3326278"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/b978-0-08-102401-0.00008-x"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2017.2666811"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2411678"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/CONECCT.2018.8482376"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2019.8720419"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1983.21282"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1984.21540"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/10460332\/10288142.pdf?arnumber=10288142","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,8]],"date-time":"2024-03-08T19:08:03Z","timestamp":1709924883000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10288142\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,3]]},"references-count":32,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2023.3325809","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"type":"print","value":"1549-7747"},{"type":"electronic","value":"1558-3791"}],"subject":[],"published":{"date-parts":[[2024,3]]}}}