{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T09:50:40Z","timestamp":1762509040265,"version":"3.37.3"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Nature Science Foundation of China","doi-asserted-by":"publisher","award":["5706002301","62374030"],"award-info":[{"award-number":["5706002301","62374030"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100008081","name":"Southeast University Startup Funding","doi-asserted-by":"publisher","award":["4006012308"],"award-info":[{"award-number":["4006012308"]}],"id":[{"id":"10.13039\/501100008081","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2024,6]]},"DOI":"10.1109\/tcsii.2023.3327256","type":"journal-article","created":{"date-parts":[[2023,10,24]],"date-time":"2023-10-24T18:15:14Z","timestamp":1698171314000},"page":"2911-2915","source":"Crossref","is-referenced-by-count":5,"title":["A 3.38-ppm\/\u00b0C Voltage Reference for Harsh Environment Applications Empowered by the In-Loop Resistance Trimming Technique"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0009-0006-5681-788X","authenticated-orcid":false,"given":"Haonan","family":"Fan","sequence":"first","affiliation":[{"name":"School of Integrated Circuits, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6499-4353","authenticated-orcid":false,"given":"Zhongyuan","family":"Fang","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Southeast University, Nanjing, China"}]},{"given":"Yongjia","family":"Li","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1573-7342","authenticated-orcid":false,"given":"Qinsong","family":"Qian","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Southeast University, Nanjing, China"}]},{"given":"Xiaozhi","family":"Kang","sequence":"additional","affiliation":[{"name":"Fusion Semi Inc., Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6988-6717","authenticated-orcid":false,"given":"Minggang","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3289-8877","authenticated-orcid":false,"given":"Weifeng","family":"Sun","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Southeast University, Nanjing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2014.2327316"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2165235"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2627544"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2018.8524827"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2550580"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIC.2019.8778113"},{"volume-title":"Semiconductor Physics and Devices: Basic Principles","year":"2003","author":"Neamen","key":"ref7"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/4.792617"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/EDM.2017.7981799"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2016.7574605"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.907226"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/wipda56483.2022.9955269"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3088157"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.3027768"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3033467"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2022.3146263"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/10561573\/10293158.pdf?arnumber=10293158","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T17:45:27Z","timestamp":1725385527000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10293158\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6]]},"references-count":16,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2023.3327256","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"type":"print","value":"1549-7747"},{"type":"electronic","value":"1558-3791"}],"subject":[],"published":{"date-parts":[[2024,6]]}}}