{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T15:58:24Z","timestamp":1780675104986,"version":"3.54.1"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62274029"],"award-info":[{"award-number":["62274029"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2024,3]]},"DOI":"10.1109\/tcsii.2023.3331842","type":"journal-article","created":{"date-parts":[[2023,11,10]],"date-time":"2023-11-10T19:24:20Z","timestamp":1699644260000},"page":"1695-1700","source":"Crossref","is-referenced-by-count":12,"title":["Intrinsic MRAM Properties Enable Security Circuits"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0009-0006-4251-1046","authenticated-orcid":false,"given":"Haoran","family":"Du","sequence":"first","affiliation":[{"name":"School of Integrated Circuits, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6917-2199","authenticated-orcid":false,"given":"You","family":"Wang","sequence":"additional","affiliation":[{"name":"College of Electronic Information and Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8379-0321","authenticated-orcid":false,"given":"Jun","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9794-8049","authenticated-orcid":false,"given":"Hao","family":"Cai","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2387353"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0039-7"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2006.311206"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.250627"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/iedm.2016.7838349"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2015.2426492"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2537792"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2018.8502431"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2018.2833543"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2018.2873970"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2014.7047039"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2879439"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2016.2583419"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2897631"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2016.2597152"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2023.3298327"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2020.3005413"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED51717.2021.9424346"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8715257"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/esscirc53450.2021.9567766"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/NANO.2018.8626347"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2015.2503432"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2320516"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2014.2325646"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/2950067.2950080"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2021.3095657"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2018.103"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401053"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3144497"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3168133"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2015.2421481"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3203817"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS54063.2022.9859327"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2021.3067173"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-023-00994-0"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-74619-5_9"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-71039-4_21"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-21040-2_12"},{"key":"ref39","volume-title":"The NIST Statistical Test Suite","author":"Rukhin","year":"2010"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2533438"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/10460332\/10314805.pdf?arnumber=10314805","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,30]],"date-time":"2024-12-30T19:49:33Z","timestamp":1735588173000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10314805\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,3]]},"references-count":40,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2023.3331842","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,3]]}}}