{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,2]],"date-time":"2026-06-02T23:56:45Z","timestamp":1780444605319,"version":"3.54.1"},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T00:00:00Z","timestamp":1711929600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T00:00:00Z","timestamp":1711929600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T00:00:00Z","timestamp":1711929600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003621","name":"Korea Government","doi-asserted-by":"publisher","award":["2020M3F3A2A01081918"],"award-info":[{"award-number":["2020M3F3A2A01081918"]}],"id":[{"id":"10.13039\/501100003621","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2024,4]]},"DOI":"10.1109\/tcsii.2023.3337754","type":"journal-article","created":{"date-parts":[[2023,12,6]],"date-time":"2023-12-06T19:26:10Z","timestamp":1701890770000},"page":"1869-1873","source":"Crossref","is-referenced-by-count":6,"title":["Split WL 6T SRAM-Based Bit Serial Computing-in-Memory Macro With High Signal Margin and High Throughput"],"prefix":"10.1109","volume":"71","author":[{"given":"Young Kyu","family":"Lee","sequence":"first","affiliation":[{"name":"School of Electrical and Electronics Engineering, Yonsei University, Seoul, Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9028-4603","authenticated-orcid":false,"given":"Dong Han","family":"Ko","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronics Engineering, Yonsei University, Seoul, Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Seokhee","family":"Cho","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronics Engineering, Yonsei University, Seoul, Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Minjune","family":"Yeo","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronics Engineering, Yonsei University, Seoul, Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mingu","family":"Kang","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of California at San Diego, La Jolla, CA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0757-2581","authenticated-orcid":false,"given":"Seong-Ook","family":"Jung","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronics Engineering, Yonsei University, Seoul, Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2963616"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.2992886"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310401"},{"key":"ref4","article-title":"Binarized neural networks: Training deep neural networks with weights and activations constrained to +1 or \u22121","author":"Courbariaux","year":"2016","journal-title":"arXiv:1602.02830"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365766"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3061508"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731754"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2880918"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2642198"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2867275"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3092759"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3031290"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3005754"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3162017"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3073254"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3199077"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2017.02.002"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/10480869\/10334469.pdf?arnumber=10334469","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,28]],"date-time":"2024-03-28T20:50:35Z","timestamp":1711659035000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10334469\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4]]},"references-count":17,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2023.3337754","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,4]]}}}