{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,27]],"date-time":"2026-02-27T15:18:00Z","timestamp":1772205480757,"version":"3.50.1"},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T00:00:00Z","timestamp":1722470400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T00:00:00Z","timestamp":1722470400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T00:00:00Z","timestamp":1722470400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62174048"],"award-info":[{"award-number":["62174048"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61834006"],"award-info":[{"award-number":["61834006"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62027815"],"award-info":[{"award-number":["62027815"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2024,8]]},"DOI":"10.1109\/tcsii.2024.3373897","type":"journal-article","created":{"date-parts":[[2024,3,6]],"date-time":"2024-03-06T19:07:04Z","timestamp":1709752024000},"page":"3930-3934","source":"Crossref","is-referenced-by-count":9,"title":["Voltage Skew-Based Test Technique for Pre-Bond TSVs in 3-D ICs"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0009-0009-5326-2657","authenticated-orcid":false,"given":"Jun","family":"Liu","sequence":"first","affiliation":[{"name":"Anhui Province Key Laboratory of Affective Computing and Advanced Intelligent Machine, School of Computer and Information, and the Intelligent Interconnected Systems Laboratory of Anhui Province, Hefei University of Technology, Hefei, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-2908-425X","authenticated-orcid":false,"given":"Zhi","family":"Chen","sequence":"additional","affiliation":[{"name":"Anhui Province Key Laboratory of Affective Computing and Advanced Intelligent Machine, School of Computer and Information, and the Intelligent Interconnected Systems Laboratory of Anhui Province, Hefei University of Technology, Hefei, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1846-3997","authenticated-orcid":false,"given":"Tian","family":"Chen","sequence":"additional","affiliation":[{"name":"Anhui Province Key Laboratory of Affective Computing and Advanced Intelligent Machine, School of Computer and Information, and the Intelligent Interconnected Systems Laboratory of Anhui Province, Hefei University of Technology, Hefei, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-1202-9094","authenticated-orcid":false,"given":"Xi","family":"Wu","sequence":"additional","affiliation":[{"name":"Anhui Province Key Laboratory of Affective Computing and Advanced Intelligent Machine, School of Computer and Information, and the Intelligent Interconnected Systems Laboratory of Anhui Province, Hefei University of Technology, Hefei, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0307-7236","authenticated-orcid":false,"given":"Huaguo","family":"Liang","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Hefei University of Technology, Hefei, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6897-4563","authenticated-orcid":false,"given":"Xiaohui","family":"Yuan","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Engineering, University of North Texas, Denton, TX, USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TMSCS.2016.2550460"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2015.2463282"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2006.873612"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICEPT.2009.5270794"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ITC-Asia.2019.00035"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2962824"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2226455"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681638"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2011.2166961"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2012.13"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2013.2259626"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2298198"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2014.6818771"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3114357"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624691"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2016.2524691"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2034508"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.92"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2474411"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-94-011-3122-3"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.884077"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/10617442\/10461082.pdf?arnumber=10461082","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,2]],"date-time":"2024-08-02T04:30:16Z","timestamp":1722573016000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10461082\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,8]]},"references-count":21,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2024.3373897","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,8]]}}}