{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,8]],"date-time":"2026-01-08T20:22:11Z","timestamp":1767903731169,"version":"3.49.0"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T00:00:00Z","timestamp":1722470400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T00:00:00Z","timestamp":1722470400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T00:00:00Z","timestamp":1722470400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52277001"],"award-info":[{"award-number":["52277001"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52307002"],"award-info":[{"award-number":["52307002"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62371073"],"award-info":[{"award-number":["62371073"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100013088","name":"Qinglan Project of Jiangsu Province","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100013088","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Postgraduate Research and Practice Innovation Program of Jiangsu Province, China","award":["KYCX23_3176"],"award-info":[{"award-number":["KYCX23_3176"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2024,8]]},"DOI":"10.1109\/tcsii.2024.3374779","type":"journal-article","created":{"date-parts":[[2024,3,8]],"date-time":"2024-03-08T19:07:09Z","timestamp":1709924829000},"page":"3980-3984","source":"Crossref","is-referenced-by-count":4,"title":["Experimental Detection for Extreme Multistability via DC-Controlled Memristor Emulator"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1200-061X","authenticated-orcid":false,"given":"Ankai","family":"Wang","sequence":"first","affiliation":[{"name":"School of Microelectronics and Control Engineering, Changzhou University, Changzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4453-8588","authenticated-orcid":false,"given":"Ning","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Microelectronics and Control Engineering, Changzhou University, Changzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9480-033X","authenticated-orcid":false,"given":"Huagan","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Microelectronics and Control Engineering, Changzhou University, Changzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1841-7608","authenticated-orcid":false,"given":"Mo","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Microelectronics and Control Engineering, Changzhou University, Changzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-022-00869-w"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2022.3160940"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2022.3223295"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2023.105702"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/29\/10\/104001"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3183340"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3223233"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2021.01.013"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108419"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2642112"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3225847"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3276983"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/5.0006020"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2907444"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2022.3220363"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2023.3319749"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1142\/S0218127418501201"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3172141"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/math10173140"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.cnsns.2020.105568"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/10617442\/10463611.pdf?arnumber=10463611","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,2]],"date-time":"2024-08-02T04:32:30Z","timestamp":1722573150000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10463611\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,8]]},"references-count":20,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2024.3374779","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,8]]}}}