{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,22]],"date-time":"2026-01-22T09:28:41Z","timestamp":1769074121679,"version":"3.49.0"},"reference-count":14,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62274034"],"award-info":[{"award-number":["62274034"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["62104036"],"award-info":[{"award-number":["62104036"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2024,9]]},"DOI":"10.1109\/tcsii.2024.3376388","type":"journal-article","created":{"date-parts":[[2024,3,18]],"date-time":"2024-03-18T20:32:00Z","timestamp":1710793920000},"page":"4196-4200","source":"Crossref","is-referenced-by-count":1,"title":["Efficient Memory Circuits Yield Analysis and Optimization Framework via Meta-Learning"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0009-0000-5736-9536","authenticated-orcid":false,"given":"Ziqi","family":"Wang","sequence":"first","affiliation":[{"name":"National Center of Technology Innovation for EDA, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1535-8975","authenticated-orcid":false,"given":"Liang","family":"Pang","sequence":"additional","affiliation":[{"name":"National Center of Technology Innovation for EDA, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1152-0055","authenticated-orcid":false,"given":"Xiao","family":"Shi","sequence":"additional","affiliation":[{"name":"National Center of Technology Innovation for EDA, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0629-7154","authenticated-orcid":false,"given":"Longxing","family":"Shi","sequence":"additional","affiliation":[{"name":"National Center of Technology Innovation for EDA, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2020.3044836"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2022.3164680"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2021.3103916"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2020.2966481"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/aspdac.2014.6742928"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2015.2404895"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2021.3068107"},{"key":"ref8","first-page":"1","article-title":"Meta-model based high-dimensional yield analysis using low-rank tensor approximation","volume-title":"Proc. 56th ACM\/IEEE Design Autom. Conf. (DAC)","author":"Shi"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2501307"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2014.2336851"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2021.3052985"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2017.2778061"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/dac18072.2020.9218611"},{"key":"ref14","first-page":"1126","article-title":"Model-agnostic meta-learning for fast adaptation of deep networks","volume-title":"Proc. Int. Conf. Mach. Learn.","author":"Finn"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/10666887\/10470409.pdf?arnumber=10470409","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T05:42:59Z","timestamp":1725687779000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10470409\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,9]]},"references-count":14,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2024.3376388","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,9]]}}}