{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,20]],"date-time":"2026-02-20T19:05:57Z","timestamp":1771614357666,"version":"3.50.1"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100014188","name":"National Research Foundation of Korea (NRF) Grant funded by the Korea Government","doi-asserted-by":"publisher","award":["2022R1A2C2092521"],"award-info":[{"award-number":["2022R1A2C2092521"]}],"id":[{"id":"10.13039\/501100014188","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003626","name":"Korea Research Institute for Defense Technology Planning and Advancement-Grant funded by Defense Acquisition Program Administration","doi-asserted-by":"publisher","award":["KRIT-CT-22-078"],"award-info":[{"award-number":["KRIT-CT-22-078"]}],"id":[{"id":"10.13039\/501100003626","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100004358","name":"Samsung","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100004358","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2024,9]]},"DOI":"10.1109\/tcsii.2024.3378204","type":"journal-article","created":{"date-parts":[[2024,3,18]],"date-time":"2024-03-18T20:32:00Z","timestamp":1710793920000},"page":"4181-4185","source":"Crossref","is-referenced-by-count":2,"title":["Hard-Decision SCL Polar Decoder With Weighted Pruning Operation for Storage Applications"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-2896-3000","authenticated-orcid":false,"given":"Dain","family":"Park","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8542-1845","authenticated-orcid":false,"given":"Dongyun","family":"Kam","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8021-4791","authenticated-orcid":false,"given":"Sangbu","family":"Yun","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8386-7704","authenticated-orcid":false,"given":"Jeongwon","family":"Choe","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2467-8276","authenticated-orcid":false,"given":"Youngjoo","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang, South Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2922983"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2875311"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.2976806"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2244361"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/COMST.2020.2967127"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401424"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401175"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2015.2439211"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2619324"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/WCNCW.2017.7919044"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2942833"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2017.2740204"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/vlsitechnologyandcir46769.2022.9830317"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3230589"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICCNC.2015.7069414"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1587\/transele.E99.C.293"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS45731.2020.9181189"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2017.2688079"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2017.2656119"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2909653"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2015.2410251"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/GLOCOM.2011.6134417"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3060585"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8920\/10666887\/10474203.pdf?arnumber=10474203","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T05:23:40Z","timestamp":1725686620000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10474203\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,9]]},"references-count":23,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2024.3378204","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,9]]}}}