{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T15:58:28Z","timestamp":1781884708650,"version":"3.54.5"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1109\/tcsii.2025.3576073","type":"journal-article","created":{"date-parts":[[2025,6,2]],"date-time":"2025-06-02T14:05:01Z","timestamp":1748873101000},"page":"1817-1821","source":"Crossref","is-referenced-by-count":4,"title":["A 13-Bit ENOB Fully Asynchronous Noise-Shaping SAR ADC With Coarse-Fine Comparison, Mismatch Error Shaping and Digital Prediction"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-3140-3309","authenticated-orcid":false,"given":"Chen","family":"Wang","sequence":"first","affiliation":[{"name":"EPIC, BioMed, imec, Leuven, Belgium"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7112-8154","authenticated-orcid":false,"given":"Hanyue","family":"Li","sequence":"additional","affiliation":[{"name":"imec, Leuven, Belgium"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9900-528X","authenticated-orcid":false,"given":"Xiaolin","family":"Yang","sequence":"additional","affiliation":[{"name":"imec, Leuven, Belgium"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1579-7262","authenticated-orcid":false,"given":"Chaohan","family":"Wang","sequence":"additional","affiliation":[{"name":"imec, Leuven, Belgium"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-0907-6445","authenticated-orcid":false,"given":"Xiaonan","family":"Xing","sequence":"additional","affiliation":[{"name":"EPIC, BioMed, imec, Leuven, Belgium"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4200-0001","authenticated-orcid":false,"given":"Carolina Mora","family":"Lopez","sequence":"additional","affiliation":[{"name":"imec, Leuven, Belgium"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7511-1923","authenticated-orcid":false,"given":"Nick Van","family":"Helleputte","sequence":"additional","affiliation":[{"name":"imec, Leuven, Belgium"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7422-5793","authenticated-orcid":false,"given":"Qiuyang","family":"Lin","sequence":"additional","affiliation":[{"name":"imec, Leuven, Belgium"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/OJSSCS.2021.3119910"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7418105"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSITechnologyandCir46769.2022.9830166"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1984.1052231"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/82.476173"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1049\/ell2.12480"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9063159"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2900150"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2742532"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365757"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2016.7844197"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2871081"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3137540"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3168588"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2023.3259821"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/CICC48029.2020.9075891"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2143870"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC60305.2024.10849289"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2217874"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/esscirc.2016.7598327"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9366008"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49661.2025.10904778"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8920\/11268900\/11021479.pdf?arnumber=11021479","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,1,13]],"date-time":"2026-01-13T21:01:54Z","timestamp":1768338114000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11021479\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12]]},"references-count":22,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2025.3576073","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,12]]}}}