{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,12]],"date-time":"2026-05-12T16:22:31Z","timestamp":1778602951542,"version":"3.51.4"},"reference-count":19,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T00:00:00Z","timestamp":1754006400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T00:00:00Z","timestamp":1754006400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T00:00:00Z","timestamp":1754006400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"International Grant","award":["IF007-2022"],"award-info":[{"award-number":["IF007-2022"]}]},{"name":"International Grant","award":["IF057-2023"],"award-info":[{"award-number":["IF057-2023"]}]},{"name":"Partnership Grant","award":["MG024-2023"],"award-info":[{"award-number":["MG024-2023"]}]},{"name":"Research Development Internal Grant","award":["RDIG\/10\/2024"],"award-info":[{"award-number":["RDIG\/10\/2024"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2025,8]]},"DOI":"10.1109\/tcsii.2025.3578345","type":"journal-article","created":{"date-parts":[[2025,6,10]],"date-time":"2025-06-10T13:55:52Z","timestamp":1749563752000},"page":"1103-1107","source":"Crossref","is-referenced-by-count":6,"title":["A Switch-as-Resistor Self-Adaptive Gate-Biasing Technique for Optimized Forward and Reverse Conduction in a CMOS Rectifier"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2462-059X","authenticated-orcid":false,"given":"Yi Chen","family":"Lee","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Faculty of Engineering, University of Malaya, Kuala Lumpur, Malaysia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3505-6525","authenticated-orcid":false,"given":"Harikrishnan","family":"Ramiah","sequence":"additional","affiliation":[{"name":"Center of Research Industry 4.0 and the Department of Electrical Engineering, Faculty of Engineering, Universiti Malaya, Kuala Lumpur, Malaysia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tian Siang","family":"Ho","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Faculty of Engineering, University of Malaya, Kuala Lumpur, Malaysia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-3035-6827","authenticated-orcid":false,"given":"Fu Qi","family":"Chua","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Faculty of Engineering, University of Malaya, Kuala Lumpur, Malaysia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-8546-9372","authenticated-orcid":false,"given":"Wen Xun","family":"Lian","sequence":"additional","affiliation":[{"name":"School of Engineering, Asia Pacific University of Technology and Innovation, Taman Teknologi Malaysia, Kuala Lumpur, Malaysia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7856-2965","authenticated-orcid":false,"given":"Kishore Kumar Pakkirisami","family":"Churchill","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Faculty of Engineering, University of Malaya, Kuala Lumpur, Malaysia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2794-1324","authenticated-orcid":false,"given":"Yong","family":"Chen","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Tsinghua University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2238264"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.35848\/1347-4065\/abbfa0"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/EUMC.2008.4751554"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3155240"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3241458"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1587\/transele.E92.C.153"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2028955"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2623821"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2023.3290178"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3099011"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2016.2591263"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2017.2785251"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2023.3285620"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2937542"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2016.2554778"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2022.3189697"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2023.3261263"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2023.3299075"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2895659"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8920\/11104806\/11029477.pdf?arnumber=11029477","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T18:17:51Z","timestamp":1754072271000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11029477\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,8]]},"references-count":19,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2025.3578345","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,8]]}}}