{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T16:38:20Z","timestamp":1781887100489,"version":"3.54.5"},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100010418","name":"Institute of Information and Communications Technology Planning and Evaluation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100010418","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Korea Government","award":["2018-0-00190"],"award-info":[{"award-number":["2018-0-00190"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2025,11]]},"DOI":"10.1109\/tcsii.2025.3581255","type":"journal-article","created":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T13:40:54Z","timestamp":1750340454000},"page":"1535-1539","source":"Crossref","is-referenced-by-count":4,"title":["A 17-fJ\/conv-step FoM\n                    <sub>w<\/sub>\n                    and 259-um\n                    <sup>2<\/sup>\n                    7-Bit C-CIDAC SAR ADC"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0009-0003-5370-7675","authenticated-orcid":false,"given":"Junmin","family":"Park","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Konkuk University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-3484-3366","authenticated-orcid":false,"given":"Joonhyun","family":"Park","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Konkuk University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-2860-6142","authenticated-orcid":false,"given":"Seungjun","family":"Song","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Konkuk University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8550-005X","authenticated-orcid":false,"given":"Hyungil","family":"Chae","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Konkuk University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42615.2023.10067573"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2020.2998473"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2022.3186064"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2016.7418106"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/cicc57935.2023.10121269"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/a-sscc58667.2023.10347948"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42613.2021.9365863"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/a-sscc60305.2024.10848566"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2020.3044624"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2023.3345926"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/mwscas.2013.6674627"},{"key":"ref12","volume-title":"ADC performance survey 1997-2024","author":"Murmann"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8920\/11230143\/11045102.pdf?arnumber=11045102","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T06:20:24Z","timestamp":1762496424000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11045102\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,11]]},"references-count":12,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2025.3581255","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,11]]}}}