{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T16:09:55Z","timestamp":1781885395164,"version":"3.54.5"},"reference-count":15,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000028","name":"Semiconductor Research Corporation","doi-asserted-by":"publisher","award":["CADT 3160"],"award-info":[{"award-number":["CADT 3160"]}],"id":[{"id":"10.13039\/100000028","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2025,11]]},"DOI":"10.1109\/tcsii.2025.3603985","type":"journal-article","created":{"date-parts":[[2025,8,29]],"date-time":"2025-08-29T17:44:48Z","timestamp":1756489488000},"page":"1650-1654","source":"Crossref","is-referenced-by-count":3,"title":["Ultra-Low Leakage Current Sensor With Large Dynamic Range"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0009-0003-8237-2384","authenticated-orcid":false,"given":"Emmanuel Nti","family":"Darko","sequence":"first","affiliation":[{"name":"Electrical Engineering Department, Iowa State University, Ames, IA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Saeid","family":"Karimpour","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, Iowa State University, Ames, IA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Daniel","family":"Adjei","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, Iowa State University, Ames, IA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3283-7449","authenticated-orcid":false,"given":"Kushagra","family":"Bhatheja","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, Ames, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5938-6329","authenticated-orcid":false,"given":"Degang","family":"Chen","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, Iowa State University, Ames, IA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2023.3334273"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.23919\/jsee.2024.000029"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/6.591665"},{"key":"ref4","volume-title":"Understand. Importance Leakage Current Meas. Adv. Technol. Nodes","year":"2024"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2012.6190631"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2010.2041258"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2011.2167624"},{"key":"ref8","volume-title":"Word line leakage detection with common mode tracking","author":"Baker","year":"2019"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3068628"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/s24216789"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IIRW59383.2023.10477703"},{"key":"ref12","volume-title":"Analog Circuit Design: A Tutorial Guide to Applications and Solutions","author":"Allen","year":"2011"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2020.3028506"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/mssc.2015.2418155"},{"key":"ref15","volume-title":"Model 6221 AC and DC Current Source Instrument Specification"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8920\/11230143\/11145170.pdf?arnumber=11145170","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T06:38:26Z","timestamp":1762497506000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11145170\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,11]]},"references-count":15,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2025.3603985","relation":{"has-preprint":[{"id-type":"doi","id":"10.36227\/techrxiv.173948624.44165046\/v1","asserted-by":"object"}]},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"value":"1549-7747","type":"print"},{"value":"1558-3791","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,11]]}}}