{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,29]],"date-time":"2026-04-29T00:26:22Z","timestamp":1777422382825,"version":"3.51.4"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2018,9,1]],"date-time":"2018-09-01T00:00:00Z","timestamp":1535760000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"Rete di Eccellenza MASTRI"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Contr. Syst. Technol."],"published-print":{"date-parts":[[2018,9]]},"DOI":"10.1109\/tcst.2017.2734046","type":"journal-article","created":{"date-parts":[[2017,10,5]],"date-time":"2017-10-05T18:12:04Z","timestamp":1507227124000},"page":"1673-1684","source":"Crossref","is-referenced-by-count":4,"title":["Improved Control Strategies for Atomic Force Microscopes in Intermittent Contact Mode"],"prefix":"10.1109","volume":"26","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2784-1486","authenticated-orcid":false,"given":"Marco","family":"Coraggio","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Martin","family":"Homer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Oliver D.","family":"Payton","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2171-4745","authenticated-orcid":false,"given":"Mario","family":"di Bernardo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/S1369-7021(10)70162-0"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijnonlinmec.2006.10.005"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2010.2051815"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.126071"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.2336113"},{"key":"ref15","year":"2015","journal-title":"MATLAB® Version 8 5 0 197613 (R2015a)"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2015.2478077"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1063\/1.3600558"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.102985"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2009.2031595"},{"key":"ref5","article-title":"Surface profiling using scanning force microscopy","author":"martin","year":"1994"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/1.1903123"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1098\/rspa.2010.0451"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MCS.2013.2279471"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s00424-007-0406-0"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.physd.2009.10.001"}],"container-title":["IEEE Transactions on Control Systems Technology"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/87\/8425800\/08059837.pdf?arnumber=8059837","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T13:34:56Z","timestamp":1643204096000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8059837\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,9]]},"references-count":16,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tcst.2017.2734046","relation":{},"ISSN":["1063-6536","1558-0865","2374-0159"],"issn-type":[{"value":"1063-6536","type":"print"},{"value":"1558-0865","type":"electronic"},{"value":"2374-0159","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,9]]}}}