{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,18]],"date-time":"2026-08-18T00:28:42Z","timestamp":1787012922305,"version":"build-2736575974"},"reference-count":81,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2021,7,1]],"date-time":"2021-07-01T00:00:00Z","timestamp":1625097600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,7,1]],"date-time":"2021-07-01T00:00:00Z","timestamp":1625097600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,7,1]],"date-time":"2021-07-01T00:00:00Z","timestamp":1625097600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100010418","name":"Institute for Information and Communications Technology Promotion (IITP) Grant","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100010418","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003621","name":"Korea Government","doi-asserted-by":"publisher","award":["2017-0-00419"],"award-info":[{"award-number":["2017-0-00419"]}],"id":[{"id":"10.13039\/501100003621","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. Video Technol."],"published-print":{"date-parts":[[2021,7]]},"DOI":"10.1109\/tcsvt.2020.3030895","type":"journal-article","created":{"date-parts":[[2020,10,14]],"date-time":"2020-10-14T15:43:47Z","timestamp":1602690227000},"page":"2602-2616","source":"Crossref","is-referenced-by-count":56,"title":["A Novel Just-Noticeable-Difference-Based Saliency-Channel Attention Residual Network for Full-Reference Image Quality Predictions"],"prefix":"10.1109","volume":"31","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0441-9605","authenticated-orcid":false,"given":"Soomin","family":"Seo","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3809-7886","authenticated-orcid":false,"given":"Sehwan","family":"Ki","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0146-5419","authenticated-orcid":false,"given":"Munchurl","family":"Kim","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref73","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2020.2966082"},{"key":"ref72","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2652339"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2012.6467150"},{"key":"ref70","doi-asserted-by":"publisher","DOI":"10.1007\/s11432-019-2757-1"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2018.2868771"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2019.2902097"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1145\/2996463"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2007.901820"},{"key":"ref75","article-title":"DeepFL-IQA: Weak supervision for deep IQA feature learning","author":"lin","year":"2020","journal-title":"arXiv 2001 08113"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2005.859378"},{"key":"ref78","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2020.2966081"},{"key":"ref79","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2016.2542580"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.118"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2014.2377181"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00689"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2005.859389"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/83.841940"},{"key":"ref35","first-page":"265","article-title":"TensorFlow: A system for large-scale machine learning","author":"abadi","year":"2016","journal-title":"Proc 12th USENIX Symp Oper Syst Design Implement"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.634"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1109\/TBC.2018.2816783"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2019.02.017"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1038\/nrn2787"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2011.2161092"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2014.224"},{"key":"ref64","doi-asserted-by":"crossref","first-page":"43","DOI":"10.1109\/TIP.2012.2214048","article-title":"Perceptual quality metric with internal generative mechanism","volume":"22","author":"wu","year":"2013","journal-title":"IEEE Trans Image Process"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2011.272"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2014.2373812"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2015.2439035"},{"key":"ref29","first-page":"1","article-title":"Adam: A method for stochastic optimization","author":"kingma","year":"2015","journal-title":"Proc Int Conf Learn Represent"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1109\/TBC.2014.2344471"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1016\/j.jvcir.2011.01.005"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1109\/TLA.2013.6710373"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2017.2760518"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2016.7533065"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2016.2545863"},{"key":"ref22","article-title":"Combining full-reference image visual quality metrics by neural network","volume":"9394","author":"lukin","year":"2015","journal-title":"Proc SPIE"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2015.2440172"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00194"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.213"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2008.2011760"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"},{"key":"ref50","first-page":"207","article-title":"What’s wrong with mean-squared error","author":"girod","year":"1993","journal-title":"Digital Images and Human Vision"},{"key":"ref51","first-page":"324","article-title":"Mean squared error: Love it or leave it? A new look at signal fidelity measures","volume":"26","author":"wang","year":"1993","journal-title":"IEEE Signal Process Mag"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2017.2788206"},{"key":"ref58","first-page":"1098","article-title":"Unsupervised feature learning framework for no-reference image quality assessment","author":"ye","year":"2012","journal-title":"Proc IEEE Conf Comput Vis Pattern Recognit"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2012.2227726"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2012.2214050"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1007\/s11760-020-01664-w"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/QoMEX.2019.8743252"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1007\/s00034-019-01110-4"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/PCS.2018.8456278"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-01234-2_18"},{"key":"ref11","article-title":"Most apparent distortion: Full-reference image quality assessment and the role of strategy","volume":"19","author":"larson","year":"2010","journal-title":"J Electron Imag"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1117\/1.3267105"},{"key":"ref12","first-page":"30","article-title":"TID2008-A database for evaluation of full-reference visual quality assessment metrics","volume":"10","author":"ponomarenko","year":"2009","journal-title":"Adv Modern Radioelectron"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.image.2014.10.009"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACSSC.2003.1292216"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2013.2293423"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2014.2346028"},{"key":"ref81","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2020.2988148"},{"key":"ref17","first-page":"305","article-title":"Modified image visual quality metrics for contrast change and mean shift accounting","author":"ponomarenko","year":"2011","journal-title":"Proc Int Conf Exper Designing Appl CAD Syst Microelectron (CADSM)"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2011.2109730"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2013.2266579"},{"key":"ref80","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2019.2898732"},{"key":"ref4","first-page":"365","article-title":"Luminance-model-based DCT quantization for color image compression","volume":"1666","author":"ahumada","year":"1992","journal-title":"Proc SPIE Human Vis Vis Process Digital Display III"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2006.881959"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2016.2539862"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/76.488822"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2016.2568459"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.165"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2016.2639451"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.667"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2018.2829819"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2019.8803390"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2017.2774045"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2019.2904879"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2011.2175935"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2010.5649275"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2016.2604042"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2012.6467149"}],"container-title":["IEEE Transactions on Circuits and Systems for Video Technology"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/76\/9471039\/09223737.pdf?arnumber=9223737","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T10:50:22Z","timestamp":1652179822000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9223737\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,7]]},"references-count":81,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tcsvt.2020.3030895","relation":{},"ISSN":["1051-8215","1558-2205"],"issn-type":[{"value":"1051-8215","type":"print"},{"value":"1558-2205","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,7]]}}}