{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,19]],"date-time":"2026-01-19T13:45:44Z","timestamp":1768830344136,"version":"3.49.0"},"reference-count":54,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61933014"],"award-info":[{"award-number":["61933014"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61773281"],"award-info":[{"award-number":["61773281"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62073029"],"award-info":[{"award-number":["62073029"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Cybern."],"published-print":{"date-parts":[[2022,12]]},"DOI":"10.1109\/tcyb.2021.3086193","type":"journal-article","created":{"date-parts":[[2021,7,8]],"date-time":"2021-07-08T19:37:25Z","timestamp":1625773045000},"page":"12687-12697","source":"Crossref","is-referenced-by-count":38,"title":["An Integrated Model-Based and Data-Driven Gap Metric Method for Fault Detection and Isolation"],"prefix":"10.1109","volume":"52","author":[{"given":"Hailang","family":"Jin","sequence":"first","affiliation":[{"name":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4566-7488","authenticated-orcid":false,"given":"Zhiqiang","family":"Zuo","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2430-7213","authenticated-orcid":false,"given":"Yijing","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5238-1357","authenticated-orcid":false,"given":"Lei","family":"Cui","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6387-6013","authenticated-orcid":false,"given":"Linlin","family":"Li","sequence":"additional","affiliation":[{"name":"School of Automation and Electrical Engineering, University of Science and Technology Beijing, Beijing, China"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.1985.1103926"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/DDCLS.2018.8516097"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2015.09.513"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1137\/S0363012998346591"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/9.53546"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/0167-6911(88)90067-9"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2014.08.022"},{"key":"ref36","author":"katayama","year":"2006","journal-title":"Subspace Methods for System Identification"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2017.2735023"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2015.09.514"},{"key":"ref28","author":"zhou","year":"1998","journal-title":"Essentials of Robust Control"},{"key":"ref27","author":"vinnicombe","year":"2001","journal-title":"Uncertainty and Feedback H? Loop-Shaping and the ?-Gap Metric"},{"key":"ref29","first-page":"149","article-title":"Unstable systems and feedback: The gap metric","author":"zames","year":"1980","journal-title":"Proc IFAC Control Sci Technol"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysconle.2005.08.004"},{"key":"ref1","article-title":"Event-triggered fault detection filter design for discrete-time memristive neural networks with time delays","author":"lin","year":"2020","journal-title":"IEEE Trans Cybern"},{"key":"ref20","article-title":"Incipient fault diagnosis for high-speed train traction systems via stacked generalization","author":"mao","year":"2020","journal-title":"IEEE Trans Cybern"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2019.2915191"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2018.2789360"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.arcontrol.2012.09.004"},{"key":"ref23","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4471-6410-4","author":"ding","year":"2014","journal-title":"Data-driven Design of Fault Diagnosis and Fault-tolerant Control Systems"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4612-0591-3"},{"key":"ref25","article-title":"Fault detection for a class of uncertain sampled-data systems using deterministic learning","author":"chen","year":"2020","journal-title":"IEEE Trans Cybern"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2010.2093879"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2015.09.008"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.3390\/pr9020300"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2013.05.018"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1155\/2017\/8937356"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.2999375"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2017.2759144"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2018.2865410"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/0005-1098(71)90028-8"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.2514\/3.21601"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/0005-1098(93)90050-4"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/0967-0661(95)00191-V"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.1976.1101146"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-3829-7"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2009.2023913"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2018.03.075"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2019.2951534"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2020.109029"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2417501"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-4799-2"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2014.2347801"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2019.2908430"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2013.2290310"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2013.2286209"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2019.0108"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3011725"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1177\/1687814017727383"},{"key":"ref47","article-title":"Novel bearing fault diagnosis algorithm based on the method of moments for stochastic resonant systems","volume":"70","author":"fu","year":"2020","journal-title":"IEEE Trans Instrum Meas"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2853702"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2866104"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2976043"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2840510"}],"container-title":["IEEE Transactions on Cybernetics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221036\/9954939\/09478332.pdf?arnumber=9478332","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,12]],"date-time":"2022-12-12T19:14:19Z","timestamp":1670872459000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9478332\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,12]]},"references-count":54,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tcyb.2021.3086193","relation":{},"ISSN":["2168-2267","2168-2275"],"issn-type":[{"value":"2168-2267","type":"print"},{"value":"2168-2275","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,12]]}}}