{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,12]],"date-time":"2026-07-12T00:13:16Z","timestamp":1783815196997,"version":"3.55.0"},"reference-count":57,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["72102093"],"award-info":[{"award-number":["72102093"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["72172115"],"award-info":[{"award-number":["72172115"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["72171105"],"award-info":[{"award-number":["72171105"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["72002209"],"award-info":[{"award-number":["72002209"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Eng. Manage."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tem.2022.3230217","type":"journal-article","created":{"date-parts":[[2022,12,30]],"date-time":"2022-12-30T18:57:07Z","timestamp":1672426627000},"page":"5057-5068","source":"Crossref","is-referenced-by-count":6,"title":["How Does Paradox Strategic Cognition Affect Radical Innovation Performance in Established Firms?"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1301-149X","authenticated-orcid":false,"given":"Xi","family":"Song","sequence":"first","affiliation":[{"name":"School of Management, Lanzhou University, Lanzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3587-7470","authenticated-orcid":false,"given":"Zelong","family":"Wei","sequence":"additional","affiliation":[{"name":"School of Management, Xi'an Jiaotong University, Xi'an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7868-5148","authenticated-orcid":false,"given":"Meng","family":"Gu","sequence":"additional","affiliation":[{"name":"School of Economics and Management, Communication University of China, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yanping","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Management, Xi'an Jiaotong University, Xi'an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.2307\/3152166"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1287\/mnsc.30.6.682"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.technovation.2012.03.001"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1111\/jpim.12113"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.technovation.2020.102160"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1177\/1069031X19866832"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1287\/orsc.2.1.71"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.technovation.2005.03.004"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tem.2022.3192094"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1509\/jmkg.64.3.1.18033"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1287\/orsc.1080.0406"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.5465\/amr.2000.3707712"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.5465\/amj.2016.0594"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.5465\/amr.2009.0223"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.5465\/amj.2011.0932"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1177\/0149206310385695"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.lrp.2016.07.003"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1002\/sej.1227"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.5465\/amr.35.2.zok202"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1002\/smj.2012"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/smj.275"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1002\/smj.598"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1111\/radm.12460"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1111\/j.1540-5885.2006.00219.x"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.technovation.2012.06.006"},{"key":"ref26","volume-title":"Radical Innovation: How Mature Companies Can Outsmart Upstarts","author":"Leifer","year":"2000"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1108\/JIC-04-2019-0065"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.lrp.2020.101991"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1111\/radm.12507"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/tem.2021.3114609"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1177\/0146167206298568"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.5465\/AMR.2007.23466005"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1111\/jpim.12380"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1177\/0021886320913048"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1177\/0021886314553101"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1177\/0018726715625343"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1111\/j.1540-5885.2012.00956.x"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1287\/orsc.2017.1116"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1287\/orsc.2021.1432"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.technovation.2020.102163"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.2307\/30040712"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/0048-7333(86)90027-2"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1016\/j.respol.2017.01.015"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1007\/s10490-021-09759-9"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1016\/j.technovation.2009.04.006"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.2307\/2393549"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/TEM.2019.2911105"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.5465\/AMJ.2006.23478255"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1016\/j.technovation.2004.11.004"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/TEM.2019.2893060"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1111\/radm.12069"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1002\/smj.821"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1016\/j.indmarman.2003.08.015"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.2307\/3069421"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1037\/\/0033-2909.103.3.411"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1177\/002224299305700304"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.2307\/3069392"}],"container-title":["IEEE Transactions on Engineering Management"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/17\/10339242\/10004380.pdf?arnumber=10004380","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,4]],"date-time":"2025-02-04T18:33:54Z","timestamp":1738694034000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10004380\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":57,"URL":"https:\/\/doi.org\/10.1109\/tem.2022.3230217","relation":{},"ISSN":["0018-9391","1558-0040"],"issn-type":[{"value":"0018-9391","type":"print"},{"value":"1558-0040","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}