{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T04:32:13Z","timestamp":1725597133478},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,10]]},"DOI":"10.1109\/tencon.2019.8929237","type":"proceedings-article","created":{"date-parts":[[2019,12,13]],"date-time":"2019-12-13T02:01:41Z","timestamp":1576202501000},"page":"1518-1522","source":"Crossref","is-referenced-by-count":0,"title":["Electric Field Stress Optimization of Permittivity Graded Spacer in UHVAC Gas Insulated System"],"prefix":"10.1109","author":[{"given":"Jacob P","family":"Varghese","sequence":"first","affiliation":[]},{"given":"Avinash Nelson","family":"Asokan","sequence":"additional","affiliation":[]},{"given":"Subham","family":"Khatua","sequence":"additional","affiliation":[]},{"given":"P","family":"Preetha","sequence":"additional","affiliation":[]},{"given":"R","family":"Sunitha","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2006.1624281"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TDC.1979.712673"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CEIDP.2015.7352128"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CATCON.2017.8280214"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1515\/ijeeps-2018-0160"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2017.07.002"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2018.8246118"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICPST.2002.1067852"}],"event":{"name":"TENCON 2019 - 2019 IEEE Region 10 Conference (TENCON)","start":{"date-parts":[[2019,10,17]]},"location":"Kochi, India","end":{"date-parts":[[2019,10,20]]}},"container-title":["TENCON 2019 - 2019 IEEE Region 10 Conference (TENCON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8910516\/8929228\/08929237.pdf?arnumber=8929237","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,19]],"date-time":"2022-07-19T20:25:07Z","timestamp":1658262307000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8929237\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,10]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/tencon.2019.8929237","relation":{},"subject":[],"published":{"date-parts":[[2019,10]]}}}