{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,27]],"date-time":"2026-01-27T23:45:32Z","timestamp":1769557532419,"version":"3.49.0"},"reference-count":16,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,10]]},"DOI":"10.1109\/tencon.2019.8929365","type":"proceedings-article","created":{"date-parts":[[2019,12,13]],"date-time":"2019-12-13T02:01:41Z","timestamp":1576202501000},"page":"2117-2122","source":"Crossref","is-referenced-by-count":14,"title":["Detection of High Impedance Fault using Machine Learning Techniques"],"prefix":"10.1109","author":[{"given":"K.V.","family":"Shihabudheen","sequence":"first","affiliation":[]},{"given":"Bijuna","family":"Kunju","sequence":"additional","affiliation":[]},{"given":"Imthias","family":"Ahammed","sequence":"additional","affiliation":[]},{"given":"Akshay","family":"Guruvarurappan","sequence":"additional","affiliation":[]},{"given":"Jibin","family":"Jose","sequence":"additional","affiliation":[]},{"given":"D.","family":"Keerthana","sequence":"additional","affiliation":[]},{"given":"P.B.","family":"Revathi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2011.01.022"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CICN.2012.122"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2017.08.039"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.egypro.2017.05.161"},{"key":"ref14","first-page":"598","article-title":"Discrete wavelet transform for image processing","volume":"4","author":"gupta","year":"2015","journal-title":"International Journal of Emerging Technology and Advanced Engineering"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2015.7178838"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"100","DOI":"10.1016\/j.knosys.2017.04.007","article-title":"Regularized extreme learning adaptive neuro-fuzzy algorithm for regression and classification","volume":"127","author":"shihabudheen","year":"2017","journal-title":"Knowledge-Based Systems"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2005.858778"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2014.2380774"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2016.0021"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2004.837836"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2016.10.021"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2014.12.022"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISGT.2017.8086048"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2014.2365855"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2016.2548942"}],"event":{"name":"TENCON 2019 - 2019 IEEE Region 10 Conference (TENCON)","location":"Kochi, India","start":{"date-parts":[[2019,10,17]]},"end":{"date-parts":[[2019,10,20]]}},"container-title":["TENCON 2019 - 2019 IEEE Region 10 Conference (TENCON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8910516\/8929228\/08929365.pdf?arnumber=8929365","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,19]],"date-time":"2022-07-19T20:23:05Z","timestamp":1658262185000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8929365\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,10]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/tencon.2019.8929365","relation":{},"subject":[],"published":{"date-parts":[[2019,10]]}}}