{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T21:12:37Z","timestamp":1725743557809},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,10]]},"DOI":"10.1109\/tencon.2019.8929684","type":"proceedings-article","created":{"date-parts":[[2019,12,13]],"date-time":"2019-12-13T02:01:41Z","timestamp":1576202501000},"page":"2222-2226","source":"Crossref","is-referenced-by-count":3,"title":["Generalized Self-discharge Model for a Series of Supercapacitors"],"prefix":"10.1109","author":[{"given":"Pankaj","family":"Saha","sequence":"first","affiliation":[]},{"given":"Kakali","family":"Roy","sequence":"additional","affiliation":[]},{"given":"Praveen","family":"Nambisan","sequence":"additional","affiliation":[]},{"given":"Munmun","family":"Khanra","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"1","article-title":"Modeling and state-of-charge estimation of supercapacitor considering leakage effect","author":"saha","year":"2019","journal-title":"IEEE Transactions on Industrial Electronics"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2019.226696"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/7.869502"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/28.821816"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2259780"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2015.03.122"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2010.11.152"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2017.03.001"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICCA.2013.6564963"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2017.03.060"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2004.03.068"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/1555816.1555849"},{"journal-title":"Maxwell HC series Ultracapacitors Datasheet","year":"0","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2017.8052901"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1021\/jz4002967"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2161096"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2008.2007116"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/S0378-7753(00)00485-7"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2494868"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2015.07.050"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/SCOPES.2016.7955667"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICCEP.2007.384288"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2012.6314697"}],"event":{"name":"TENCON 2019 - 2019 IEEE Region 10 Conference (TENCON)","start":{"date-parts":[[2019,10,17]]},"location":"Kochi, India","end":{"date-parts":[[2019,10,20]]}},"container-title":["TENCON 2019 - 2019 IEEE Region 10 Conference (TENCON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8910516\/8929228\/08929684.pdf?arnumber=8929684","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,19]],"date-time":"2022-07-19T20:25:10Z","timestamp":1658262310000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8929684\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,10]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/tencon.2019.8929684","relation":{},"subject":[],"published":{"date-parts":[[2019,10]]}}}