{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T05:44:34Z","timestamp":1743486274496,"version":"3.28.0"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,11,16]],"date-time":"2020-11-16T00:00:00Z","timestamp":1605484800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,11,16]],"date-time":"2020-11-16T00:00:00Z","timestamp":1605484800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,11,16]],"date-time":"2020-11-16T00:00:00Z","timestamp":1605484800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,11,16]]},"DOI":"10.1109\/tencon50793.2020.9293821","type":"proceedings-article","created":{"date-parts":[[2020,12,22]],"date-time":"2020-12-22T21:10:24Z","timestamp":1608671424000},"page":"20-25","source":"Crossref","is-referenced-by-count":2,"title":["Investigation of analog single event transient on low noise amplifier in X and Ka bands"],"prefix":"10.1109","author":[{"given":"P.","family":"Rajendiran","sequence":"first","affiliation":[]},{"given":"R.","family":"Srinivasan","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.820766"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2012.2200502"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/2660540.2660985"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.908166"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2289368"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2509250"},{"key":"ref16","first-page":"31","article-title":"Heavy ion impact on narrowband cascoded low noise amplifier, Microelectronics Reliability","volume":"91","author":"rajendiran","year":"2018"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s10825-019-01370-y"},{"key":"ref18","article-title":"Managing Process Variation in Intel’s 45nm CMOS Technology","volume":"12","author":"kuhn","year":"2008","journal-title":"Intel Technology Journal"},{"key":"ref19","first-page":"62","article-title":"SPICE simulation and tradeoffs of CMOS LNA performance with source-degeneration inductor","volume":"47","author":"tsui","year":"2000","journal-title":"IEEE Trans on Circuits and Systems-II Analog and Digital Signal Processing"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DRC.2006.305055"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.894325"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.909844"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2369347"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2496967"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2016.2637873"},{"key":"ref2","first-page":"190","article-title":"A Highly Integrated 60GHz CMOS Front-End Receiver","author":"emami","year":"2007","journal-title":"ISSCC Dig Tech Papers"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"3781","DOI":"10.1109\/TNS.2004.839215","article-title":"Proton radiation response of monolithic millimeter-wave transceiver building blocks implemented in 200 GHz SiGe technology","volume":"51","author":"kuo","year":"2004","journal-title":"IEEE Transactions on Nuclear Science"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2491220"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2011033"},{"key":"ref21","article-title":"A 2.4 GHz CMOS low noise amplifier using an inter-stage matching inductor","volume":"2","author":"kim","year":"1999","journal-title":"Circuits and Systems 1999 42nd Midwest Symposium on"}],"event":{"name":"TENCON 2020 - 2020 IEEE REGION 10 CONFERENCE (TENCON)","start":{"date-parts":[[2020,11,16]]},"location":"Osaka, Japan","end":{"date-parts":[[2020,11,19]]}},"container-title":["2020 IEEE REGION 10 CONFERENCE (TENCON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9293567\/9293692\/09293821.pdf?arnumber=9293821","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,30]],"date-time":"2022-06-30T15:17:07Z","timestamp":1656602227000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9293821\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11,16]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/tencon50793.2020.9293821","relation":{},"subject":[],"published":{"date-parts":[[2020,11,16]]}}}