{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,26]],"date-time":"2025-11-26T16:45:34Z","timestamp":1764175534908,"version":"3.28.0"},"reference-count":28,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,31]],"date-time":"2023-10-31T00:00:00Z","timestamp":1698710400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,31]],"date-time":"2023-10-31T00:00:00Z","timestamp":1698710400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,31]]},"DOI":"10.1109\/tencon58879.2023.10322385","type":"proceedings-article","created":{"date-parts":[[2023,11,22]],"date-time":"2023-11-22T14:07:19Z","timestamp":1700662039000},"page":"301-305","source":"Crossref","is-referenced-by-count":2,"title":["Low Power Gate Voltage Controlled Schmitt Trigger with Adjustable Hysteresis and 0.1V<sub>th<\/sub> Margin in 22nm FDSOI"],"prefix":"10.1109","author":[{"given":"Marc Macbeth M.","family":"Toledo","sequence":"first","affiliation":[{"name":"Mindanao State University - Iligan Institute of Technology,Microelectronics laboratory,Department of Electrical Engineering and Technology,Iligan City,Philippines,9200"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jefferson A.","family":"Hora","sequence":"additional","affiliation":[{"name":"Mindanao State University - Iligan Institute of Technology,Microelectronics laboratory,Department of Electrical Engineering and Technology,Iligan City,Philippines,9200"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/ip-g-1.1984.0037"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICIS.2017.7960008"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICCTICT.2016.7514629"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/81.260219"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/el:20031131"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/19.87026"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2012.6292056"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/mop.27111"},{"journal-title":"The use of hysteresis with comparators and how it affects functionality","year":"0","author":"aggarwal","key":"ref17"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2006.884174"},{"key":"ref19","first-page":"357","article-title":"Differential voltage (?V) comparator with variable channel-size mosfet","volume":"87","author":"kosasayama","year":"2004","journal-title":"IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1049\/el:19860142"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.857313"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/IranianCEE.2019.8786613"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ICST46873.2019.9047726"},{"key":"ref25","first-page":"229","author":"narendra","year":"1999","journal-title":"Impact of using adaptive body bias to compensate die-to-die vt variation on within-die vt variation"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2008.4541823"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICACCCT.2014.7019142"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1049\/el:20052799"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/HNICEM48295.2019.9073358"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/IC4.2015.7375630"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICMSAO.2011.5775531"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1049\/el:20081301"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2015.2427992"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/mop.27588"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/mop.27262"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCEREC.2018.8711999"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2012.6291965"}],"event":{"name":"TENCON 2023 - 2023 IEEE Region 10 Conference (TENCON)","start":{"date-parts":[[2023,10,31]]},"location":"Chiang Mai, Thailand","end":{"date-parts":[[2023,11,3]]}},"container-title":["TENCON 2023 - 2023 IEEE Region 10 Conference (TENCON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10322307\/10322308\/10322385.pdf?arnumber=10322385","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,30]],"date-time":"2023-11-30T19:13:53Z","timestamp":1701371633000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10322385\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,31]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/tencon58879.2023.10322385","relation":{},"subject":[],"published":{"date-parts":[[2023,10,31]]}}}