{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,19]],"date-time":"2026-02-19T08:04:10Z","timestamp":1771488250786,"version":"3.50.1"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T00:00:00Z","timestamp":1761523200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T00:00:00Z","timestamp":1761523200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,10,27]]},"DOI":"10.1109\/tencon66050.2025.11375557","type":"proceedings-article","created":{"date-parts":[[2026,2,18]],"date-time":"2026-02-18T21:13:38Z","timestamp":1771449218000},"page":"436-439","source":"Crossref","is-referenced-by-count":0,"title":["Frequency Dependence of Electron Emission Current from Crystal Defects in AlGaN\/GaN HEMTs"],"prefix":"10.1109","author":[{"given":"Hideki","family":"Hoji","sequence":"first","affiliation":[{"name":"Chukyo University,Department of Electrical and Electronic Engineering,Nagoya,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Soichi","family":"Sano","sequence":"additional","affiliation":[{"name":"Chukyo University,Department of Electrical and Electronic Engineering,Nagoya,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jyunya","family":"Takeda","sequence":"additional","affiliation":[{"name":"Chukyo University,Department of Electrical and Electronic Engineering,Nagoya,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hirohisa","family":"Taguchi","sequence":"additional","affiliation":[{"name":"Chukyo University,Department of Electrical and Electronic Engineering,Nagoya,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/adom.201400131"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.pquantelec.2020.100247"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/adom.202402777"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3390\/electronics8121401"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.202001045"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/pip.715"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.200800672"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.jcrysgro.2003.08.024"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2012.09.004"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/5.0037079"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.rinp.2020.103714"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jcrysgro.2022.126669"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.jcrysgro.2023.127459"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.tsf.2024.140246"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1088\/0034-4885\/79\/5\/056501"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6641\/acca9d"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tencon61640.2024.10902944"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2018.2808334"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/jeds.2021.3132429"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1088\/2631-8695\/acb131"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.25046\/aj030526"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/16.906428"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1002\/ifm2.27"}],"event":{"name":"TENCON 2025 - 2025 IEEE Region 10 Conference (TENCON)","location":"Kota Kinabalu, Malaysia","start":{"date-parts":[[2025,10,27]]},"end":{"date-parts":[[2025,10,30]]}},"container-title":["TENCON 2025 - 2025 IEEE Region 10 Conference (TENCON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11373911\/11374914\/11375557.pdf?arnumber=11375557","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,19]],"date-time":"2026-02-19T07:02:44Z","timestamp":1771484564000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11375557\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10,27]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/tencon66050.2025.11375557","relation":{},"subject":[],"published":{"date-parts":[[2025,10,27]]}}}