{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T08:42:51Z","timestamp":1743410571766},"reference-count":13,"publisher":"Int. Test Conference","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.1998.743254","type":"proceedings-article","created":{"date-parts":[[2002,11,27]],"date-time":"2002-11-27T23:21:56Z","timestamp":1038439316000},"page":"733-739","source":"Crossref","is-referenced-by-count":16,"title":["Diagnosis and characterization of timing-related defects by time-dependent light emission"],"prefix":"10.1109","author":[{"given":"D.","family":"Knebel","sequence":"first","affiliation":[]},{"given":"P.","family":"Sanda","sequence":"additional","affiliation":[]},{"given":"M.","family":"McManus","sequence":"additional","affiliation":[]},{"given":"J.A.","family":"Kash","sequence":"additional","affiliation":[]},{"given":"J.C.","family":"Tsang","sequence":"additional","affiliation":[]},{"given":"D.","family":"Vallett","sequence":"additional","affiliation":[]},{"given":"L.","family":"Huisman","sequence":"additional","affiliation":[]},{"given":"P.","family":"Nigh","sequence":"additional","affiliation":[]},{"given":"R.","family":"Rizzolo","sequence":"additional","affiliation":[]},{"family":"Peilin Song","sequence":"additional","affiliation":[]},{"given":"F.","family":"Motika","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"55","article-title":"The Use of Light Emission in Failure Analysis","author":"hawkins","year":"1990","journal-title":"Proc Int Symp Testing and Failure Analysis"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/VTEST.1997.600334"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1007\/BF00135333"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1002\/1521-3951(199711)204:1<507::AID-PSSB507>3.0.CO;2-V"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/54.605998"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/54.606001"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/55.596927"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1063\/1.118305"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/TEST.1997.639632"},{"key":"ref7","article-title":"Backside Optical Emission Diagnostics for Excess IDDq","author":"kash","year":"0","journal-title":"Proceedings of the 1997 IEEE Custom Integrated Circuits Conference"},{"key":"ref2","first-page":"1","article-title":"The Sematech Failure Analysis Roadmap","author":"kudva","year":"1995","journal-title":"Proc Int l Symp Testing and Failure Analysis"},{"year":"1997","journal-title":"The National Technology Roadmap for Semiconductors","key":"ref1"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TEST.1997.639631"}],"event":{"acronym":"TEST-98","name":"International Test Conference 1998","location":"Washington, DC, USA"},"container-title":["Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx4\/5947\/15907\/00743254.pdf?arnumber=743254","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,10]],"date-time":"2017-03-10T06:51:14Z","timestamp":1489128674000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/743254\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/test.1998.743254","relation":{},"subject":[]}}